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In the GB/s regime, accurate modeling of insertion loss and phase delay is a precursor to successful high-speed serial link designs. We propose a causal (physically meaningful) form of the Hammerstad and Cannonball-Huray metal roughness frequency dependent complex correction factor. Compared to the widely used, non-causal form, it considerably increases the inductive component of internal metal impedance. Transmission lines simulated with a causal version demonstrate increased phase delay, and characteristic impedance. By obtaining the dielectric and roughness parameters, solely from manufacturers' data sheets, we validate the model through a detailed case study to test the model`s accuracy.
Metal roughness models used in simulators are non-causal and cause inaccurate simulation results. We derive and explore causal version of Hammerstad, Huray and Cannonball-Huray (C-H) roughness models. We show that causal roughness model increases internal metal's inductance. Consequently, transmission line model has larger phase delay and characteristic impedance.Byaccepting roughness parameters solely from manufacturers' data sheets, and using causal version of Cannon-ball-Huray model, a case studyusing FR408HR/RTFshow excellent simulation correlation to 50GHz.
The target audience is anyone who is involved in the design and fabrication of high-speed circuit cards and/or backplanes, and needs to be able to accurately estimate PCB transmission line losses and phase delay in the GB/s regime from first principles. A basic understanding of transmission line theory, dielectric and metal properties, S-parameters, PCB stackup and fabrication would be useful.