• Conference
    Jan 30-Feb 1, 2018
  • Expo
    Jan 31-Feb 1, 2018
  • Santa Clara Convention
    | Santa Clara, CA

DesignCon 2018 Schedule Builder

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A NIST Traceable PCB Kit for Evaluating the Accuracy of De-Embedding Algorithms and Corresponding Metrics

Location: Ballroom G
Pass Types: 2-Day Pass, All Access Pass, Alumni All Access Pass - Get your pass now!
Track: 13. Applying Test and Measurement Methodology
Audience Level: Intermediate
Format: 45-Minute Technical Session
Audience Level: Intermediate
Recording: TBD

In this presentation we will introduce the two de-embedding/fixture removal techniques that have been gaining traction in the industry (2x-Thru and 1x-Reflect) comparing them with other fixture removal techniques. We will then describe a NIST traceable methodology to evaluate the de-embedding accuracy of these techniques for single-ended and coupled differential applications using a series of PCB test coupons. We will also discuss the appropriate metrics needed to evaluate the accuracy of the de-embedding algorithms.


Understanding of the basics of the 2x-Thru and 1x-reflect de-embedding algorithms, understanding how to evaluate the accuracy of those algorithms using a set of real physical PCB test coupons. Understanding of the type of metrics that can be used to evaluate the accuracy of those algorithms.

Intended Audience

knowledge of PCB design basics and S-Parameters