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13. Applying Test and Measurement Methodology
45-Minute Technical Session
Audience Level: Intermediate
In this presentation we will introduce the two de-embedding/fixture removal techniques that have been gaining traction in the industry (2x-Thru and 1x-Reflect) comparing them with other fixture removal techniques. We will then describe a NIST traceable methodology to evaluate the de-embedding accuracy of these techniques for single-ended and coupled differential applications using a series of PCB test coupons. We will also discuss the appropriate metrics needed to evaluate the accuracy of the de-embedding algorithms.
Understanding of the basics of the 2x-Thru and 1x-reflect de-embedding algorithms, understanding how to evaluate the accuracy of those algorithms using a set of real physical PCB test coupons. Understanding of the type of metrics that can be used to evaluate the accuracy of those algorithms.