• Conference
    Jan 30-Feb 1, 2018
  • Expo
    Jan 31-Feb 1, 2018
  • Santa Clara Convention
    | Santa Clara, CA

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Decompositional Analysis of Copper Roughness Effect and Complex Permittivity – Part II

  • Nicke Svee (Sr Specialist R&D, Ericsson AB)
  • Jun Wang (signal integrity engineer, Ericsson AB)
  • Davood Khoda (Signal Integrity design engineer, Ericsson AB)
Location: Ballroom E
Pass Types: 2-Day Pass, All Access Pass, Alumni All Access Pass - Get your pass now!
Track: 14. Modeling and Analysis of Interconnects
Audience Level: All
Format: 45-Minute Technical Session
Audience Level: All
Recording: TBD

From VNA measured structures it's possible to decompose the structure, and extract the roughness correction factor and the complex permittivity by using the EBBE (Ericsson Broad Band Extraction) algorithm.
In this paper the extraction algorithm is thoroughly explained and shown.
Great emphasis is also put on explaining and modelling of the roughness correction factor.
The combination of models for conductor losses, roughness correction factor and dielectric losses are compared against both measurements and 3D solvers in both time domain and frequency domain.
The temperature effect on both copper and complex permittivity are shown and the moisture effect on complex permittivity.


Explanation of the deficiencies in the current most used extraction principles, models for roughness correction factor and the complex permittivity. Also the effects relative importance are shown.