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Improving TDECQ and SNDR for Better Characterization of Serial Data Signals, and Path From Mask Test to TDEC, SNDR, and TDECQ Measurements

Maria Agoston (Principal Engineer, Tektronix)

Pavel Zivny (Domain Expert, Tektronix)

Richard Mellitz (Principal Engineer, Samtec)

Kan Tan (Principal Engineer, Tektronix)

Jan Peeters Weem (Principal Engineer, Tektronix)

Location: Ballroom G

Date: Thursday, February 1

Time: 2:50pm - 3:30pm

Pass Type: 2-Day Pass, All Access Pass, Alumni All Access Pass - Get your pass now!

Track: 09. Measurement, Simulation, and Optimization of Jitter, Noise, and Timing to Minimize Errors

Audience Level: Advanced

Format: 40-Minute Technical Session

Vault Recording: TBD

Audience Level: Advanced

The test of high speed serial data signals has developed from mask test to TDEC, transmitter and dispersion eye closure. With signaling moving to PAM4, measurements move in two directions: SNDR for PAM4– signal to noise and distortion ratio, a transmitter test tool which sums noise and other non-compensable features into one figure-of-merit number; and the TDECQ, transmitter and dispersion eye closure penalty quaternary. We summarize these developments, and in an original work we show improvements for SNDR and TDECQ for the near future.

Takeaway

SNDR is over pessimistic, and we propose to quantify the "pessimism", and present an improved algorithm for enhanced accuracy, and show the improvements.
Users find TDECQ measurements non-intuitive and hard to visualize. We highlight to tools that could be used to enhance the analysis capabilities of TDECQ. Specific examples will be presented.

Intended Audience

We document the progression of mask test to TDEC (Transmitter and dispersion eye closure penalty) and to PAM4's SNDR and TDECQ measurements; (signal to noise and distortion ratio, and transmitter and dispersion eye closure quaternary). We present improvements for each SNDR and TDECQ for the near future.