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In-Situ De-embedding

Ching-Chao Huang (President , AtaiTec Corporation)

Location: Great America Meeting Room 2

Date: Wednesday, January 31

Time: 9:20am - 10:00am

Pass Type: 2-Day Pass, All Access Pass, Alumni All Access Pass, Boot Camp Pass, Expo Pass - Get your pass now!

Track: Sponsored Session (Free)

Audience Level: Intermediate

Format: 40-Minute Technical Session

Vault Recording: Not Recorded

Audience Level: Intermediate

Rohde & Schwarz, Inc.

Traditional de-embedding methods can give non-causal error in device-under-test (DUT) results if the test fixture and calibration structure have different impedance. This presentation introduces In-Situ De-embedding (ISD) that addresses such impedance difference through software instead of hardware, thereby improving de-embedding accuracy while reducing hardware cost.