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Changwook YoonSystem SI/PI EngineerIntel

Changwook Yoon (S’05-M’12) is currently a System SI/PI Engineer at Intel and working on signal/power integrity analysis of various parallel interfaces. Before he joined Intel, he was an assistant visiting research professor at Missouri University of Science and Technology (MST), Rolla, Missouri, US for two years and senior engineer at Samsung Advanced Institute of Technology (SAIT), Giheung, Korea for two years. He received the B.S., M.S. and Ph.D degree in electrical engineering from Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Korea in 2005, 2007, and 2010, respectively. He has a total of ten years of research experience with signal/power integrity.