April 5-7, 2022|Santa Clara Convention Center| Santa Clara, CA


Welcome to the DesignCon 2022 agenda and presentation download site. Here you can view and download conference, Chiphead Theater, and other event presentations before, during, and after the event. If you're looking for a presentation from a specific session that you're unable to find here, it is likely because the presenter has not provided permission for external use or has not yet shared their presentation with us. Please check back after the event for a more complete catalog of available presentations.

Tutorial – PAM6 Signaling: A Potential Candidate at 224Gbps

Speakers: Geoff Zhang  (AMD), Zhaoyin Daniel Wu  (AMD), Jinbiao Xu  (AMD), Hongtao Zhang  (AMD)

Location: Ballroom AB

Track: 09. High-Speed Signal Processing, Equalization & Coding/FEC, 07. Optimizing High-Speed Link Design

Format: Tutorial

Theme : Data Centers

Education Level: All

Pass Type: All Access Pass

Tutorial – The Real World of Power Integrity & Signal Integrity Working Together

Speakers: Heidi Barnes  (Keysight Technologies), Steve Sandler  (Picotest.com), Jack Carrel  (AMD)

Location: Ballroom EF

Track: 10. Power Integrity in Power Distribution Networks

Format: Tutorial

Theme : Automotive, Data Centers

Education Level: All

Pass Type: All Access Pass

Panel – The Case of the Closing Eyes: PAM-N, What Can be Tested?

Moderator: Chris Loberg  (Tektronix)

Panelists: Cathy Liu  (Broadcom), Mark Marlett  (Marvell Semiconductor), Mike Li  (Intel), Hiroshi Goto  (Anritsu), Greg LeCheminant  (Keysight Technologies), Pavel Zivny  (Tektronix), Ransom Stephens  (BitifEye Digital Test Solutions GmbH)

Location: Ballroom GH

Track: 08. Measurement & Simulation Techniques for Analyzing Jitter, Noise & BER, 12. Applying Test & Measurement Methodology

Format: Panel Discussion

Theme : High-speed Communications

Education Level: All

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Panel — Bringing AI to the Edge: Hardware & Software Enables Autonomous AI Ecosystem on the Edge

Moderator: Christian Kurzke  (MontaVista Linux)

Panelists: Devin Matthews  (Blue River Technology), Priya Muralidharan  (Infineon Technologies)

Speaker: Jim Gallagher  (MontaVista Software)

Location: Ballroom C

Track: Drive World - Advanced Automotive

Format: Panel Discussion

Theme : Autonomous, Sensing/Vision Systems

Education Level: Introductory

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Validation of Achieving 200Gbps Signaling per Electrical Lane Over 1 Meter of Passive Twinaxial Copper Cable

Speakers: Christopher DiMinico  (MC Communications/PHY-SI LLC/SenTekse), Michael Klempa  (Amphenol ICC), David Nozadze  (Cisco Systems), Michael Rowlands  (Amphenol HSC)

Authors: Mike Resso  (Keysight Technologies), Curtis Donahue  (Rohde & Schwarz), Oj Danzy  (Keysight Technologies), Richard Mellitz  (Samtec), Mike Sapozhnikov  (Cisco Systems), Amendra Koul  (Cisco Systems), Adee Ran  (Cisco Systems), Upen Reddy Kareti  (Cisco Systems)

Location: Ballroom H

Track: 13. Modeling & Analysis of Interconnects, 12. Applying Test & Measurement Methodology

Format: Technical Session

Theme : High-speed Communications

Education Level: Introductory

Pass Type: 2-Day Pass, All Access Pass

Challenges & Solutions in Physical Layer Testing for Automotive Wired Communications

Speakers: Julien Henaut  (BitifEye Digital Test Solutions GmbH), Kevin Kershner  (Keysight Technologies)

Location: Ballroom C

Track: Drive World - Advanced Automotive

Format: Technical Session

Theme : Automotive, High-speed Communications

Education Level: All

Pass Type: 2-Day Pass, All Access Pass

DDR4-3200 FPGA-based System with Interposer Power Aware SI Simulation to Measurement Correlation

Speakers: Benjamin Dannan  (Northrop Grumman), Randy White  (Keysight Technologies)

Authors: Hermann Ruckerbauer  (Eye Know How), HeeSoo Lee  (Keysight Technologies)

Location: Ballroom E

Track: 06. System Co-Design: Modeling, Simulation & Measurement Validation, 08. Measurement & Simulation Techniques for Analyzing Jitter, Noise & BER

Format: Technical Session

Theme : High-speed Communications

Education Level: All

Pass Type: 2-Day Pass, All Access Pass

Improved Methodology to Accurately Perform System Level Power Integrity Analysis Including an ASIC Die

Speakers: James Kuszewski  (Northrop Grumman), Ramzi Vincent  (Northrop Grumman), William McCaffrey  (Northrop Grumman), Albert Park  (Northrop Grumman), Benjamin Dannan  (Northrop Grumman)

Author: Shin Wu  (Northrop Grumman)

Location: Ballroom F

Track: 01. Signal & Power Integrity for Single-Multi Die, Interposer & Packaging, 02. Chip I/O & Power Modeling

Format: Technical Session

Theme : Data Centers, High-speed Communications

Education Level: All

Pass Type: 2-Day Pass, All Access Pass

PCIe® 5.0 Live Demo

Speaker: John James  (Anritsu)

Location: Mission City Ballroom B5

Track: Sponsored Session

Format: Sponsored Session

Education Level: All

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Security Integrity Analytics by Thermal Side-channel Simulation: An ML-augmented Auto-POI Approach

Speakers: Jimin Wen  (Ansys), Norman Chang  (Ansys), Lang Lin  (Ansys), David Luo  (National Taiwan University), Jyh-Shing Roger Jang  (National Taiwan University), Hua Chen  (Ansys)

Location: Ballroom H

Track: 14. Machine Learning for Microelectronics, Signaling & System Design, 10. Power Integrity in Power Distribution Networks

Format: Technical Session

Theme : Automotive, Security

Education Level: All

Pass Type: 2-Day Pass, All Access Pass

Panel – Modeling Passive Component for Power Integrity Simulations: How to Measure, How to Model, How to Use

Moderator: Heidi Barnes  (Keysight Technologies)

Panelists: Istvan Novak  (Samtec), Steve Sandler  (Picotest.com), Jim DeLap  (ANSYS), Joe Hock  (Kyocera - AVX), Eric Bogatin  (University of Colorado, Boulder)

Location: Ballroom H

Track: 10. Power Integrity in Power Distribution Networks, 12. Applying Test & Measurement Methodology

Format: Panel Discussion

Theme : Automotive, Data Centers

Education Level: All

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Panel – OIF Electrical I/O Specifications: Progress on CEI 112Gbps & 224Gbps

Moderator: Nathan Tracy  (TE Connectivity)

Panelists: Cathy Liu  (Broadcom Inc.), John Calvin  (Keysight Technologies), Mike Li  (Intel), Jeffery Maki  (Juniper Networks)

Location: Ballroom D

Track: 09. High-Speed Signal Processing, Equalization & Coding/FEC, 07. Optimizing High-Speed Link Design

Format: Panel Discussion

Theme : Data Centers, High-speed Communications

Education Level: All

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Equalizer (Tx/Rx) Optimization at 112Gbps

Speakers: Kalev Sepp  (Sepson Analytics), Ryan Chodora  (Keysight Technologies)

Authors: John Calvin  (Keysight Technologies), Varun Garg  (Keysight Technologies)

Location: Ballroom H

Track: 12. Applying Test & Measurement Methodology, 09. High-Speed Signal Processing, Equalization & Coding/FEC

Format: Technical Session

Theme : Data Centers, High-speed Communications

Education Level: All

Pass Type: 2-Day Pass, All Access Pass

Advanced Testing Challenges at 32GBaud PAM4 with PCIe 6.0

Speakers: Rick Eads  (Keysight Technologies), Pegah Alavi  (Keysight Technologies)

Location: Mission City Ballroom B4

Track: Sponsored Session

Format: Sponsored Session

Education Level: All

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Next Gen Development in Type-C Ecosystem

Speakers: Jit Lim  (Keysight Technologies), Pedro Merlo  (Keysight Technologies)

Location: Mission City Ballroom B4

Track: Sponsored Session

Format: Sponsored Session

Education Level: All

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Quick Guide to Recalibrate Your Signal Integrity Intuition for PCI Express Applications

Speakers: Mike Resso  (Keysight Technologies), Saish Sawant  (Keysight Technologies)

Location: Mission City Ballroom B4

Track: Sponsored Session

Format: Sponsored Session

Education Level: All

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Practical Methods of Estimating Dynamic Current for Calculating PDN Target Z

Speakers: Heidi Barnes  (Keysight Technologies), Steve Sandler  (Picotest.com)

Author: Jack Carrel  (AMD)

Location: Ballroom H

Track: 10. Power Integrity in Power Distribution Networks, 02. Chip I/O & Power Modeling

Format: Technical Session

Theme : Automotive

Education Level: All

Pass Type: 2-Day Pass, All Access Pass

Solving Your Forward Error Correction Problems

Speaker: Mike Beyers  (Keysight Technologies)

Location: Mission City Ballroom B4

Track: Sponsored Session

Format: Sponsored Session

Education Level: All

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Physical Layer Validation Challenges of Characterizing 100/200 Gbps/lane Designs

Speaker: John Calvin  (Keysight Technologies)

Location: Mission City Ballroom B4

Track: Sponsored Session

Format: Sponsored Session

Education Level: All

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Applications of High Bandwidth AWGs in Receiver Testing: Tricks of the Trade

Speaker: Julien Henaut  (BitifEye Digital Test Solutions GmbH)

Authors: Anton M. Unakafov  (BitifEye Digital Test Solutions GmbH), Ransom Stephens  (BitifEye Digital Test Solutions GmbH), Nithin Parameshwaraiah  (BitifEye Digital Test Solutions GmbH), Afshin Attarzadeh  (BitifEye Digital Test Solutions GmbH), Valentina Unakafova  (BitifEye Digital Test Solutions GmbH)

Location: Ballroom E

Track: 12. Applying Test & Measurement Methodology, 07. Optimizing High-Speed Link Design

Format: Technical Session

Theme : High-speed Communications

Education Level: Introductory

Pass Type: 2-Day Pass, All Access Pass

How To Efficiently Build and Analyze Memory Bus to Meet DDR Specification

Speakers: HeeSoo Lee  (Keysight Technologies), Shaishav Pandya  (Keysight Technologies)

Location: Mission City Ballroom B4

Track: Sponsored Session

Format: Sponsored Session

Education Level: All

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Exploring the Requirements for 224Gbps Channel Characterization Using Simulations & Measurements

Speakers: Rick Rabinovich  (Keysight Technologies), Mike Resso  (Keysight Technologies)

Authors: Luis Boluña  (Keysight Technologies), John Calvin  (Keysight Technologies), Francesco de Paulis  (University of L'Aquila), Richard Mellitz  (Samtec)

Location: Ballroom F

Track: 07. Optimizing High-Speed Link Design, 12. Applying Test & Measurement Methodology

Format: Technical Session

Theme : High-speed Communications

Education Level: All

Pass Type: 2-Day Pass, All Access Pass

Power Integrity Simulation and Measurement Tips and Tricks

Speakers: Heidi Barnes  (Keysight Technologies), Don Schoenecker  (Keysight Technologies)

Location: Mission City Ballroom B4

Track: Sponsored Session

Format: Sponsored Session

Education Level: All

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Panel – PCIe6.0: Ingredients for Success

Moderator: Pegah Alavi  (Keysight Technologies)

Panelists: Tim Wig  (Intel), Steve Krooswyk  (Samtec), Rick Eads  (Keysight Technologies), David Bouse  (Tektronix), Madhumita Sanyal  (Synopsys), Ying Li  (NVIDIA), Patrick Casher  (FIT-Foxconn)

Location: Ballroom D

Track: 06. System Co-Design: Modeling, Simulation & Measurement Validation, 13. Modeling & Analysis of Interconnects

Format: Panel Discussion

Theme : High-speed Communications

Education Level: All

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Panel – Test on Wheels: Test & Measurement for Automotive Standards

Moderator: Julien Henaut  (BitifEye Digital Test Solutions GmbH)

Panelists: Edo Cohen  (Valens), Ajeya Gupta  (Ford Motor Company), Kevin Kershner  (Keysight Technologies), Dr. Kirsten Matheus  (BMW Group), Laxman Vemury  (Analog Devices), Shawn Prestridge  (IAR Systems)

Location: Ballroom C

Track: Drive World - Advanced Automotive, 07. Optimizing High-Speed Link Design

Format: Panel Discussion

Theme : Automotive

Education Level: All

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Pegah Alavi

Title: Solutions Engineer

Company: Keysight Technologies

Pegah is a Senior Solutions Engineer at Keysight Technologies, where she focuses on Signal Integrity and High Speed Digital Systems and Applications. Prior to joining Keysight Technologies, Pegah worked on system level modeling of analog and mixed signal circuits in order to best predict the overall systems performance and accurately represent each component.

Barnes, Heidi

Title: SI and PI Applications Engineer

Company: Keysight Technologies

Heidi Barnes is a Senior Application Engineer for High Speed Digital applications in the EEsof EDA Group of Keysight Technologies. Her recent activities include the application of electromagnetic, transient, and channel simulators to solve signal and power integrity challenges. Author of over 20 papers on SI and PI and recipient of the DesignCon 2017 Engineer of the Year. Experience includes 6 years designing ATE test fixtures for Verigy, 6 years in RF/Microwave microcircuit packaging for Agilent Technologies, and 10 years with NASA in the aerospace industry. Heidi graduated from the California Institute of Technology in 1986 with a bachelor’s degree in electrical engineering. She has been with Keysight EEsof since 2012.

Beyers, Mike

Title: Infiniium Product Planner

Company: Keysight Technologies

Mike Beyers is Keysight’s product planner for the Infiniium line of high-performance real-time oscilloscopes.  He has 29 years of experience in the test and measurement business including HW, SW, FPGA and ASIC design for oscilloscopes, product and ASIC planning, and R&D project management.  Mike lives with his family in Colorado Springs, CO and is an avid skier and cyclist. 

Boluña, Luis

Title: Senior Applications Engineer

Company: Keysight Technologies

Luis Boluña is a Senior Application Engineer for Keysight Technologies. He has extensive experience in both the measurement and simulation of high speed SerDes architectures and backplane designs. His background is Signal Integrity and Mixed Signal Circuit Design. He has worked in Silicon Valley almost 28 years with Agilent, Cisco Systems, Rambus, Microsoft, and National Semiconductor. His research interests are in system design, testability, simulation, and validation of high speed designs.

Calvin, John

Title: Senior Strategic Planner, IP Wireline Solutions

Company: Keysight Technologies

Ryan Chodora

Title: R&D Software Engineer

Company: Keysight Technologies

Ryan Chodora is a measurement development engineer for Keysight Technologies. He is responsible for new measurement algorithms and firmware for the Keysight sampling oscilloscope product line, with particular focus on jitter decomposition algorithms and equalizer development. Ryan has a BSEE from the University of California San Diego.

Dannan, Benjamin

Title: Staff Digital Engineer

Company: Northrop Grumman

Benjamin Dannan is a Technical Fellow and a Staff Digital Engineer at Northrop Grumman Mission Systems, with a multi-faceted background that includes a wide range of professional engineering as well as military experiences. He is a senior member of IEEE, with professional engineering experience that includes designing multiple systems and platforms to meet requirements for high-volume, high-reliability, harsh environments. He is a specialist in signal and power integrity, high-speed circuit and multi-layered PCB design, as well as has multiple years of experience with EMC product development and certifications to support global product launches. Benjamin holds a certification in cybersecurity, has a BSEE from Purdue University, a Masters of Engineering in Electrical Engineering from The Pennsylvania State University, and graduated from the USAF Undergraduate Combat Systems Officer training school with an aeronautical rating. Benjamin is a trained Electronic Warfare Officer in the USAF with deployments on the EC-130J Commando Solo in Afghanistan and Iraq totaling 47 combat missions, as well as a trained USAF Cyber Operations Officer. In addition, he has co-authored multiple peer-reviewed journal publications. He received the prestigious DesignCon best paper award in 2020, given to authors leading as practitioners in semiconductor and electronic design. Lastly, Benjamin is also a Keysight Certified Expert in ADS.

Danzy, Oj

Title: Senior RF and Mcrowave Application Engineer

Company: Keysight Technologies

O.J. Danzy is a Senior RF and Microwave Application Engineer at Keysight Technologies specializing in areas surrounding physical layer test, network analysis, test system design and automation. Most recently he has focused on standards-based test system design and development, fixture removal and in-fixture calibration methods and techniques for multiport network analysis applications. He received Bachelor of Science in Electrical Engineering from Tennessee State University and a Master of Electrical Engineering from Cornell University.

Eads, Rick

Title: Principle Computer IO Segment Manager

Company: Keysight Technologies

Rick Eads is a principal program manager at Keysight Technologies with expertise in technical/industrial marketing of test and measurement tools and electronic design automation software in the computer, semi-conductor, communications, and storage industries worldwide. Rick's specialty is precision product and solution definition. He provides technical leadership in driving standards within industry organizations for PCI Express, CCIX, GenZ, OCP, NVM Express, CEI 4.0, IEEE 802.3, ExpressCard, DDR, SATA, and InfiniBand. He markets test and measurement products covering oscilloscopes and associated compliance software tools, vector network analyzers, bit error ratio testers (BERTs) and EDA tools. Rick earned a MBA from the University of Colorado and holds a BSEE from Brigham Young University with an emphasis on digital design and computer architecture. Rick actively contributes to the development of the PCIe physical layer BASE, CEM, and Test specifications and has led electrical Gold Suite testing at PCI-SIG workshops worldwide since 2004.

Gallagher, Jim

Title: Director of Sales, North America

Company: MontaVista Software

Jim has over 30 years of success working with customers and partners in the embedded and security solutions industries.  With technical sales and marketing experience, Jim has successfully introduced, evangelized and grown disruptive technologies to the networking, medical, industrial, military aerospace, and service provider markets.  Before joining MontaVista Software, Jim managed sales teams at both QNX (now Blackberry) and Codenomicon (now Synopsys).  He has also had successful sales roles at Shenick Network Systems, (acquired by Cobham), BreakingPoint Systems (now Keysight Technologies),  WindRiver, and Motorola.  

At MontaVista Software, Jim is responsible for sales in North America focusing on the emerging Intelligent Edge/IoT, Security, Network infrastructure markets along with growing MontaVista’s MVShield CentOS/Rocky Linux services.  He is also managing outbound marketing activities and partner relationships.

Jim has a BS in Computer Science from the University of California, Riverside.

Garg, Varun

Title: Senior R&D Engineer

Company: Keysight Technologies

Varun Gargis a lead measurement scientist for Keysight Technologies and is responsible for measurement systems integration and solutions around emerging high speed networking standards. He works for Keysight (formerly Agilent) for over 15years and holds a bachelor’s degree in computer science from Kurukshetra University, India.

James, John

Title: Field Application Engineer

Company: Anritsu

John James is a Field Applications Engineer with Anritsu. John has over 25 years of experience in telecommunications, test and measurement, protocol, high-speed interconnects, and embedded systems. Prior to joining Anritsu, John has worked at Intel, Keysight, and Teledyne LeCroy. John holds a Bachelor of Science in Electrical Engineering from North Carolina State University, Raleigh, NC.

Kershner, Kevin

Title: Solution Architect for in-vehicle network test

Company: Keysight Technologies

In 16 years with Keysight, Kevin has held multiple roles as an applications engineer and digital system specialist. He has experience using oscilloscopes, BERTs, and logic analyzers to test electrical standards such as USB, DisplayPort, DDR, MIPI, and various forms of Ethernet. Kevin earned his Bachelors of Science in Electrical and Computer Engineering from UCLA in 2005.

LeCheminant, Greg

Title: Test Applications Engineer

Company: Keysight Technologies

Greg D. Le Cheminant is a Measurement Applications Specialist and Strategic Planner for digital communications analysis products in the Internet Infrastructure Solutions Group.  He is responsible for development of new measurement applications and products for the groups optical communications test products.  He represents Keysight on several industry standards committees.

Greg's experience at Keysight/Agilent/Hewlett-Packard began in 1985 with five years in manufacturing engineering, and the remainder in various technical marketing positions. He is a contributing author to four textbooks on high-speed digital communications and has written numerous technical articles on test related topics.  He holds two patents.  Greg earned BSEET and MSEE degrees from Brigham Young University

Lee, HeeSoo

Title: DDR/SerDes Product Owner

Company: Keysight Technologies

HeeSoo Lee is the DDR/SerDes product owner and an App Dev master scientist in the PathWave Software Solutions (PSS) group at Keysight Technologies. He has held several different positions since 1989 in Keysight/Agilent/Hewlett-Packard, including consulting business manager, technical marketing lead, and field applications engineer. Previously, he worked for Daeryung Ind. Inc. as a RF/MW circuit design engineer. He has over 30 years of design and simulation experience in RF, microwave, and high speed digital designs. He graduated with a BSEE degree from the Hankuk Aviation University, South Korea.

Lim, Jit

Title: Standards and Solutions Lead for USB and Thunderbolt

Company: Keysight Technologies

 Jit Lim has been enabling customers for 35 years in Test and Measurement since graduating from MIT in 1986. He has published numerous technical papers and helped many world-wide customers characterize and validate their leading-edge designs. Today, Jit Lim is Keysight’s Strategic Planner for USB and Thunderbolt solutions. He has published numerous technical papers and helped many world-wide customers characterize and validate their leading-edge designs. Today, Jit Lim is Keysight’s Standards and Solutions lead for USB and Thunderbolt.

Merlo, Pedro

Title: Solution Planner for the DisplayPort, USB and Thunderbolt technologies

Company: Keysight Technologies

Pedro Merlo holds a Master’s Degree in Telecommunication Engineering and has broad experience in High-Speed Digital debug and characterization, being a key contributor to the USB Implementers Forum and VESA standard committees. Today, Pedro is Keysight’s Solution Planner for the DisplayPort, USB and Thunderbolt technologies.

Pandya, Shaishav

Title: R&D Software Engineer

Company: Keysight Technologies

Shaishav Pandya is an R&D software engineer at Keysight Technologies, where is he works on developing memory design applications in ADS. He has been part of the Memory Designer team since its initial conception, working on various aspects of the product design and development. Shaishav completed his bachelor’s in Electronics and Telecommunication Engineering from University of Mumbai. He then obtained a master’s degree in Electrical and Computer Engineering from Georgia Institute of Technology in 2015. Shaishav has been working with Keysight ever since, initially working on netlist parsing and model initialization for transistor models in Keysight’s GoldenGate RFIC simulator and ADS, before embarking on his current role.

Nithin Parameshwaraiah

Title: Application Expert

Company: BitifEye Digital Test Solutions GmbH

Nithin Parameshwaraiah is working as an Application Expert at BitifEye Digital Test Solutions. He started his career at BitifEye as a Software developer and helped in the development of physical layer test automation software for several applications. He is interested to work on challenging problems and helps Keysight AE’s to solve complex issues faced by Keysight and BitifEye customer’s with respect to Rx testing.

Rabinovich, Rick

Title: Distinguished Engineer

Company: Keysight Technologies

Rick Rabinovich, IEEE802.3 Ethernet voter member, is a Distinguished Engineer at Keysight Technologies, specialized in 3D modeling of electromagnetic structures and PCB stackup optimization for 10G/25G/50G/100G/200G/400 GbE. Former IEEE Communication Society member, Rick was a Senior Principal Design Engineer at Alcatel-Lucent and an Alcatel-Lucent Bell Labs Distinguished Member of the Technical Staff. He has authored several technical articles in the IEEE Communications and EDN magazines and holds two US patents in communications. Rick's previous positions include Hardware Technology Director and Fellow Associate at Spirent Communications, and senior position at Northrop. Rick holds a BS from the Buenos Aires University Engineering College and attended computer post-graduate courses at Cal State Los Angeles, UCLA, and UCI.

Resso, Mike

Title: Signal Integrity Application Scientist

Company: Keysight Technologies

Mike Resso is the Signal Integrity Application Scientist in the Internet Infrastructure Solution Group of Keysight Technologies and has over thirty years of experience in the test and measurement industry. His background includes the design and development of electro-optic test instrumentation for aerospace and commercial applications. His most recent activity has focused on the complete multiport characterization of high speed digital interconnects using Time Domain Reflectometry and Vector Network Analysis. He has authored over 30 professional publications including two books on signal integrity. Mike has been awarded one US patent and has twice received the Agilent “Spark of Insight” Award for his contribution to the company. He received a Bachelor of Science degree in Electrical and Computer Engineering from University of California.

Sandler, Steve

Title: Founder

Company: Picotest.com

Steve Sandler has been involved with power system engineering for more than 40 years. Steve is the founder of PICOTEST.com, a company specializing in power integrity solutions including measurement products, services and training. He frequently lectures and leads workshops internationally on the topics of power, PDN and distributed systems and is a Keysight certified expert for EDA software. Steve frequently writes articles and books related to power supply and PDN performance and his latest book, Power Integrity Using ADS was published by Faraday Press in 2019. Steve founded AEi Systems, a well-established leader in worst case circuit analysis and troubleshooting of high reliability systems.

Sawant, Saish

Title: Application Development Engineer

Company: Keysight Technologies

Saish Sawant is Application Development Engineer with Keysight Technologies - PathWave Software Solutions group. He is a recent graduate from University of Colorado –Boulder with focus on RF/Microwave and Signal Integrity. Prior to graduate school, he worked for Society of Applied Microwave Electronics Engineering & Research (SAMEER), a Government of India R&D institute in Mumbai, India as Research Scientist developing RF frontend sub-systems.

Schoenecker, Don

Title: Product Planner

Company: Keysight Technologies

Don Schoenecker is Keysight’s product planner for mid-range Infiniium and InfiniiVision general purpose oscilloscopes. Supporting R&D development of products from Keysight Technologies for 30 years, Don has extensive knowledge of oscilloscope solutions and methods for testing power applications and analysis requirements.

A graduate of Texas A&M University with a degree in electrical engineering. Don lives in Aiken, South Carolina, and is a golfer, hiker, and beach lover.

Kalev Sepp

Title: Senior Consultant

Company: Sepson Analytics

Kalev is the owner of at Sepson Analytics LLC providing signal integrity and measurement methodology consultation for Video Electronics Standards Association (VESA) and Keysight Technologies

Wen, Jimin

Title: Principal R&D Engineer

Company: Ansys

Jimin Wen is a Principal R&D engineer and works on power, thermal, and security integrity analysis technologies in Ansys. His research interests also include AI/ML-based EDA solutions for the modern chip-package-system design. Before 2016, Jimin was with Keysight on the high-speed channel and signal integrity simulation. From 2008-2014 he worked at Cadence on RF simulation and wireless verification technologies. Jimin received his Ph.D. in EE from Chinese Academy of Sciences in 2008.

White, Randy

Title: Memory Solutions Program Manager

Company: Keysight Technologies

Randy White is the Memory Solutions Program Manager for Keysight Technologies. He is focused on test methodologies for emerging memory technologies for server, mobile and embedded applications. Randy has spent the last 16+ years investigating signal integrity measurement techniques including de-embedding algorithms, measurement/model correlation and high speed measurements for real-time & sampling oscilloscopes as well as BERTs & AWGs. He has participated on many standards committees including PCI-SIG, USB-IF, SATA-IO, JEDEC to help define new test methodologies. He graduated with a BSEE from Oregon State University.

Xu, Jinbiao

Title: Senior Staff Engineer

Company: AMD

Jinbiao Xu received his Ph.D. degree in Communications and Electrical Engineering from Xidian University, Xi’an, China in 1997.  He joined AMD in February 2022 and is now working on SerDes architecture and modeling. From 2018 to 2022, he works for Xilinx. From 2014 to 2018, he worked at Keysight Technologies as an application engineer to provide customized services of Keysight ADS, SystemVue and instruments.  During 2000 to 2014, he worked on Wireless System Design (such as 3G WCDMA, 4G LTE and etc) at Agilent Technologies, Beijing, China. His current interests are SerDes architecture development and modeling, advanced wireless (5G NR and 6G), and digital front end (DFE) design.