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Welcome to the DesignCon 2020 agenda and presentation download site. Here you can view and download conference and/or Chiphead Theater presentations before, during, and after the event. If you’re looking for a presentation from a specific session that you’re unable to find here, it is likely because the presenter has not provided permission for external use or has not yet shared their presentation with us. Please check back after the event for a more complete catalogue of available presentations.

Boot Camp – Relating SI & PI for High-Speed Digital Boards: FPGA DDR4 Case Study

Speakers: Jack Carrel  (Xilinx), Steve Sandler  (Picotest), Heidi Barnes  (Keysight)

Location: Ballroom G

Track: 06. System Co-Design: Modeling, Simulation & Measurement Validation

Format: Boot Camp

Pass Type: All-Access Pass, Alumni All-Access Pass, Boot Camp Pass

Tutorial – Introduction to the IEEE P370 Standard & Its Applications for High Speed Interconnect Characterization

Speakers: Xiaoning Ye  (Intel Corp), Jay Diepenbrock  (SIRF Consultants, LLC), Heidi Barnes  (Keysight), Eric Bogatin  (Teledyne LeCroy), Mikheil Tsiklauri  (Missouri University of Science and Technology), Jason Ellison  (Amphenol), Se-Jung Moon  (Intel), Jose Moreira  (Advantest), Ching-Chao Huang  (AtaiTec Corporation)

Location: Ballroom B

Track: 12. Applying Test & Measurement Methodology

Format: Tutorial

Pass Type: All-Access Pass, Alumni All-Access Pass

Panel – The Case of the Closing Eyes: PAM is the Answer, or Not?

Moderator: Cathy Liu  (Broadcom)

Panelists: Chris Loberg  (Tektronix, Inc.), Mark Marlett  (Inphi Corp), Mike Li  (Intel), Ransom Stephens  (Ransom's Notes), Pavel Zivny  (Tektronix), Greg LeCheminant  (Keysight Technologies), Hiroshi Goto  (Anritsu)

Location: Ballroom F

Track: 08. Measurement, Simulation & Improving Jitter, Noise & BER (Pre & Post FEC)

Format: Panel Discussion

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass, Boot Camp Pass, Expo Pass

Welcome Reception - Sponsored by Keysight Technologies

Location: Santa Clara Ballroom, Hyatt Regency

Track: Welcome Reception

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass, Boot Camp Pass

Preparing to Test & Avoid Pitfalls in Your USB4 Implementations

Speaker: Jit Lim  (Keysight Technologies)

Location: Ballroom G

Track: 12. Applying Test & Measurement Methodology

Format: Technical Session

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass

DDR5/LPDDR5 Design, Debug, Probing, and Validation Challenges and Solutions

Speakers: Jennie Grosslight  (Keysight Technologies), Stephen Slater  (Keysight Technologies), Stephanie Rubalcava

Location: Great America 1

Track: Keysight Education Forum

End-to-End System-Level Simulations with Retimers for PCIe Gen5 & CXL: A How-To Guide

Speakers: Casey Morrison  (Astera Labs, Inc.), Elene Chobanyan  (Hewlett Packard Enterprise), Pegah Alavi  (Keysight)

Location: Ballroom D

Track: 06. System Co-Design: Modeling, Simulation & Measurement Validation, 13. Modeling & Analysis of Interconnects

Format: Technical Session

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass

Signal Integrity Simulation and Measurement Correlation: Getting Smart with Beatty Standard

Speakers: Mike Resso  (Keysight Technologies), Chun-ting "Tim" Wang Lee  (Keysight Technologies)

Location: Great America 1

Track: Keysight Education Forum

Be prepared to test next-gen Type-C technologies – eUSB2, USB 3.2, and USB4

Speaker: Jit Lim  (Keysight Technologies)

Location: Great America 1

Track: Keysight Education Forum

PCI Express Rockets Forward to 64GT/s: Phy Layer Testing Challenges at 32G NRZ and 64G PAM4

Speakers: Rick Eads  (Keysight Technologies), Pegah Alavi  (Keysight)

Location: Great America 1

Track: Keysight Education Forum

Panel – Stump the SI/PI Experts

Moderator: Eric Bogatin  (Teledyne LeCroy and Univ of Colorado Boulder)

Speakers: Istvan Novak  (Samtec), Steve Sandler  (Picotest), Vladimir Dmitriev Zdorov  (Mentor Graphics), Larry Smith  (Micron)

Location: Chiphead Theater

Track: Chiphead Theater

Format: Chiphead Theater Session

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass, Boot Camp Pass, Expo Pass

Leading Edge + Mainstream Technologies: Everything is Moving to Next Generation

Speaker: Brig Asay  (Keysight Technologies)

Location: Chiphead Theater

Track: Chiphead Theater

Format: Chiphead Theater Session

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass, Boot Camp Pass, Expo Pass

Measuring Oscilloscope Voltage Probe Performance

Speaker: Steve Sandler  (Picotest)

Location: Ballroom C

Track: 12. Applying Test & Measurement Methodology, 10. Power Integrity in Power Distribution Networks

Format: Technical Session

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass

Panel – Enabling New Architectures: An Update on OIF's CEI-112G Electrical Interfaces

Moderator: Nathan Tracy  (TE Connectivity)

Panelists: Cathy Liu  (Broadcom Inc.), Steve Sekel  (Keysight Technologies), Ed Frlan  (Semtech), Gary Nicholl  (Cisco), Mike Li  (Intel)

Location: Ballroom F

Track: 07. Optimizing High-Speed Serial Design

Format: Panel Discussion

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass, Boot Camp Pass, Expo Pass

Validation of Achieving 100-Gbps Signaling per Electrical Lane Over 2 Meters of Passive Twin Axial Copper Cable

Speaker: CHRISTOPHER DIMINICO  (PHY-SI LLC)

Authors: Richard Mellitz  (Samtec), OJ Danzy  (Keysight Technologies), Michael Resso  (Keysight Technologies), Mike Sapozhnikov  (Cisco Systems), Michael Klempa  (UNH-IOL)

Location: Ballroom D

Track: 13. Modeling & Analysis of Interconnects, 12. Applying Test & Measurement Methodology

Format: Technical Session

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass

Data Center and Optical Network Innovation: Enabling the 5G Ecosystem

Speaker: Beate Hoehne  (Keysight Technologies)

Location: Great America 1

Track: Keysight Education Forum

Updates on the Challenges of Characterizing 112 Gbps/Lane Designs

Speakers: Rob Sleigh  (Keysight Technologies), John Calvin  (Keysight Technologies)

Location: Great America 1

Track: Keysight Education Forum

Practical Bit Error Rate and RS(544,514) FEC Testing and Troubleshooting for PAM4 Links

Speakers: Steve Sekel  (Keysight Technologies), Charles Seifert  (Keysight Technologies)

Location: Great America 1

Track: Keysight Education Forum

What You Need to Know Before Simulating DDR5 Memory Designs

Speaker: Hee-Soo Lee  (Keysight Technologies)

Location: Great America 1

Track: Keysight Education Forum

A Method for Dynamic Load Current Testing with a Benchtop Power Supply

Speakers: Heidi Barnes  (Keysight Technologies), Jack Carrel  (Xilinx), Steve Sandler  (Picotest)

Location: Ballroom B

Track: 12. Applying Test & Measurement Methodology, 10. Power Integrity in Power Distribution Networks

Format: Technical Session

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass

Panel – What's Next? How to Jumpstart Your Career

Moderator: Suzanne Deffree  (Informa Markets (formerly UBM))

Panelists: Steve Sandler  (Picotest), Charles Lord  (Blue Ridge Advanced Design and Automation), George Chao  (Manex Consulting), Eric Bogatin  (Teledyne LeCroy and Univ of Colorado Boulder), Ryan Cousins  (krtkl inc.)

Location: Career Zone - Room M2

Track: Career Zone

Format: Career Zone Session

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass, Boot Camp Pass, Expo Pass

Jitter Measurements with Decision Feedback Equalization

Speaker: Kalev Sepp  (Sepson Analytics LLC)

Author: John Calvin  (Keysight Technologies)

Location: Ballroom F

Track: 12. Applying Test & Measurement Methodology, 08. Measurement, Simulation & Improving Jitter, Noise & BER (Pre & Post FEC)

Format: Technical Session

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass

Panel – Untangling Standards: The Challenges Inside the Box

Moderator: Jay Diepenbrock  (SIRF Consultants, LLC)

Panelists: Cristian Filip  (Mentor Graphics), Ken Schmahl  (Achronix Semiconductor), Stephanie Rubalcava  (Keysight Technologies)

Location: Chiphead Theater

Track: Chiphead Theater

Format: Chiphead Theater Session

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass, Boot Camp Pass, Expo Pass

Panel – Electronic Design Automation Roadmap for Machine Learning & AI Standardization

Moderator: John Ellis  (Silicon Integration Initiative, Inc.)

Panelists: Leigh Anne Clevenger  (Silicon Integration Initiative, Inc.), Rhett Davis  (North Carolina State University), Leon Stok  (IBM), Norman Chang  (ANSYS), Ramond Rodríguez  (Intel)

Location: Ballroom D

Format: Panel Discussion

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass, Boot Camp Pass, Expo Pass

Panel – PCIe 32G & 64G: System Design & Test Challenges

Moderator: Pegah Alavi  (Keysight)

Panelists: Steve Krooswyk  (Samtec), Rita Horner  (Synopsys), Ying Li  (NVIDIA), Dan Froelich  (Tektronix), Patrick Casher  (Foxconn Interconnect Technology), David Bouse  (Tektronix), Rick Eads  (Keysight), Tim Wig  (Intel)

Location: Ballroom F

Track: 07. Optimizing High-Speed Serial Design

Format: Panel Discussion

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass, Boot Camp Pass, Expo Pass

Alavi, Pegah

Title: Director

Company: Keysight

Alavi, Pegah

Title: Director

Company: Keysight

Asay, Brig

Title: Director Strategic Planning – Internet Infrastructure Group

Company: Keysight Technologies

Brig Asay manages strategic planning for Keysight Technologies’ Internet Infrastructure group.

Brig joined Keysight Technologies in 2005.  During his time with Keysight, he has held the following positions:

  • Infiniium Oscilloscope Marketing Manager, where he managed marketing strategies and planning for the Infiniium Oscilloscope lineup.
  • Marketing Operations Manager, where he oversaw the marketing budget and managed the technical support and learning products teams.
  • Marketing Product Manager, where he launched the 90000 X and Q-Series oscilloscope.
Previously to Keysight, Brig worked at Micron Technologies, Inc.  Brig graduated with an MBA from Northwest Nazarene University and BS Electrical Engineering from the University of Wyoming.  He has published numerous articles.

Barnes, Heidi

Title: SI and PI Applications Engineer

Company: Keysight Technologies

Heidi Barnes is a Senior Application Engineer for High Speed Digital applications in the EEsof EDA Group of Keysight Technologies. Her recent activities include the application of electromagnetic, transient, and channel simulators to solve signal and power integrity challenges. Author of over 20 papers on SI and PI and recipient of the DesignCon 2017 Engineer of the Year. Experience includes 6 years designing ATE test fixtures for Verigy, 6 years in RF/Microwave microcircuit packaging for Agilent Technologies, and 10 years with NASA in the aerospace industry. Heidi graduated from the California Institute of Technology in 1986 with a bachelor’s degree in electrical engineering. She has been with Keysight EEsof since 2012.

Calvin, John

Title: Senior Strategic Planner - IP Wireline Solutions

Company: Keysight Technologies

Danzy, OJ

Title: Senior RF and Microwave Application Engineer

Company: Keysight Technologies

O.J. Danzy is a Senior RF and Microwave Application Engineer at Keysight Technologies specializing in areas surrounding physical layer test, network analysis, test system design and automation. Most recently he has focused on fixture removal techniques, standards compliance measurement systems and techniques for multiport network analysis applications. He received Bachelor of Science in Electrical Engineering from Tennessee State University and a Master of Electrical Engineering from Cornell University

Rhett Davis

Title: Professor, Electrical and Computer Engineering

Company: North Carolina State University

W. Rhett Davis is a Professor of Electrical and Computer Engineering at North Carolina State University, and a founding faculty member of the Center for Advanced Electronics through Machine Learning (CAEML). He received B.S. degrees in electrical and computer engineering from North Carolina State University, Raleigh, in 1994 and M.S. and Ph.D. degrees in electrical engineering from the University of California at Berkeley in 1997 and 2002. He received the National Science Foundation’s Faculty Early Career Development (CAREER) award in 2007. He received the Distinguished Service Award from the Silicon Integration Initiative (Si2) in 2012 for his research in the development of standards for electronic design automation (EDA) and his development of the FreePDK open-source, predictive process design kit. He works currently with Si2 to develop standards for system-level power-modeling and compact modeling of device reliability. He has been an IEEE member since 1993 and became a Senior Member in 2011. He has published over 50 scholarly journal and conference articles. He has worked briefly at Hewlett-Packard (now Keysight) in Boeblingen, Germany and consulted for Chameleon Systems, Qualcomm, BEECube, and Silicon Cloud International. Dr. Davis' research is centered on electronic design automation for integrated systems in emerging technologies. He is best known for his efforts in design enablement, 3DIC design, thermal analysis, circuit simulation, and power modeling for systems-on-chip and chip multi-processors.

Rick Eads

Title: Principal PCI Express Program Manager, PCISIG Board Member

Company: Keysight

Rick Eads is a principal program manager at Keysight Technologies with expertise in technical/industrial marketing of test and measurement tools and electronic design automation software in the computer, semi-conductor, communications, and storage industries worldwide. Rick's specialty is precision product and solution definition. He provides technical leadership in driving standards within industry organizations for PCI Express, CCIX, GenZ, OCP, NVM Express, CEI 4.0, IEEE 802.3, ExpressCard, DDR, SATA, and InfiniBand. He markets test and measurement products covering oscilloscopes and associated compliance software tools, vector network analyzers, bit error ratio testers (BERTs) and EDA tools. Rick earned a MBA from the University of Colorado and holds a BSEE from Brigham Young University with an emphasis on digital design and computer architecture. Rick actively contributes to the development of the PCIe physical layer BASE, CEM, and Test specifications and has led electrical Gold Suite testing at PCI-SIG workshops worldwide since 2004.

Grosslight, Jennie

Title: Memory Protocol Solutions Manager

Company: Keysight Technologies

Jennie Grosslight is Keysight's Memory Protocol Solutions Manager where she is responsible for Keysight's logic analysis and compliance test solutions for memory applications. Jennie has worked for HP, Agilent, and Keysight for 30 years for oscilloscopes and logic analyzers in a variety of roles including R&D engineer, technical marketing engineer, business development, and product marketing engineer. She has been focused on helping engineers analyze and validate memory systems for the past 20 years. Jennie has a degree in Electrical Engineering from the University of Colorado at Colorado Springs.

Hoehne, Beate

Title: Business Development Manager, Internet Infrastructure Networks and Data Centers

Company: Keysight Technologies

Beate Hoehne leads an international team of business development engineers responsible for the development and implementation of effective sales, marketing and business strategies for Keysight’s worldwide Networks and
Data Centers portfolio. Beate joined Keysight Technologies (formerly Hewlett-Packard and Agilent Technologies) in 1989 as a consultant in the computer business. During her 27-year career within the company, she held various Marketing positions including · Strategic product and business planning
· Sales development for a start-up business · Marketing Manager for an OEM Business focusing on customer relationship management. · Product Manager for Pulse Pattern Generators and Arbitrary Waveform Generators
· NPI and Launch Manager for a comprehensive digital, photonic and sources product portfolio. Beate was born in Paderborn, Germany and holds a degree in Business Computer Science.

LeCheminant, Greg

Title: Measurement Applications Specialist

Company: Keysight Technologies

Greg Le Cheminant is a Measurement Applications Specialist for digital communications analysis products in the Internet Infrastructure Solutions Group. He is responsible for development of new measurement applications for the group's optical communications test products. He represents Keysight on several industry standards committees. Greg's experience at Keysight/Agilent/Hewlett-Packard began in 1985 with five years in manufacturing engineering, and the remainder in various technical marketing positions. He is a contributing author to four textbooks on high-speed digital communications and has written numerous technical articles on test related topics. He holds two patents. Greg earned BSEET and MSEE degrees from Brigham Young University.

Lee, Hee-Soo

Title: SerDes/DDR Product Owner

Company: Keysight Technologies

HeeSoo LEE is the SerDes/DDR product owner in the EEsof EDA group of Keysight Technologies DES division, located Santa Rosa California, USA. He has held several different positions in Keysight Technologies, Agilent Technologies, and Hewlett-Packard including consulting business manager, technical marketing lead, and field applications engineer since 1989. Before, he worked for Daeryung Ind. Inc. as a RF/MW circuit design engineer. He has over 30 years of design and simulation experience in the area of RF, microwave, and high-speed digital designs. He graduated with a BSEE degree from the Hankuk Aviation University, South Korea.

Lim, Jit

Title: Strategic Planner

Company: Keysight Technologies

Jit Lim has been enabling customers for over 33 years in Test and Measurement since graduating from MIT in 1986. He has published numerous technical papers and helped many world-wide customers characterize and validate their leading-edge designs. Today Jit Lim is Keysight’s Strategic Planner for USB and Thunderbolt solutions.

Resso, Michael

Title: Signal Integrity Application Scientist

Company: Keysight Technologies

Mike Resso is the Signal Integrity Application Scientist in the Component Test Division of Keysight Technologies and has over twenty-five years of experience in the test and measurement industry. His background includes the design and development of electrooptic test instrumentation for aerospace and commercial applications. His most recent activity has focused on the complete multiport characterization of high speed digital interconnects using Time Domain Reflectometry and Vector Network Analysis. He has authored over 30 professional publications including a book on signal integrity. He received a Bachelor of Science degree in Electrical and Computer Engineering from University of California

Resso, Mike

Title: Signal Integrity Application Scientist

Company: Keysight Technologies

Mike Resso is the Signal Integrity Application Scientist in the Internet Infrastructure Solution Group of Keysight Technologies and has over twenty-five years of experience in the test and measurement industry. His background includes the design and development of electro-optic test instrumentation for aerospace and commercial applications. His most recent activity has focused on the complete multiport characterization of high speed digital interconnects using Time Domain Reflectometry and Vector Network Analysis. He has authored over 30 professional publications including a book on signal integrity. Mike has been awarded one US patent and he received a Bachelor of Science degree in Electrical and Computer Engineering from University of California.

Rubalcava, Stephanie

Title: R&D Solution Architect and Developer

Stephanie Rubalcava is an R&D Solution Architect and Developer for Keysight.  She works with solutions for PAM-4 and DDR.  Stephanie has a degree in Electrical Engineer from BYU, and an MBA from Regis University.  She has worked with Agilent and Keysight for over 12 years developing solutions, proposing measurement science methods in JEDEC, and working with customers to define measurement solutions.  Prior to working with Agilent and Keysight, she was 10 years at a memory company.

Sandler, Steve

Title: Founder of Picotest

Company: Picotest

Steve Sandler has been involved with power system engineering for nearly 40 years. Steve is the founder of PICOTEST.com, a company specializing in power integrity solutions including measurement products, services and training. He frequently lectures and leads workshops internationally on the topics of power, PDN and distributed systems and is a Keysight certified expert for EDA software. Steve frequently writes articles and books related to power supply and PDN performance and his latest book, Power Integrity: Measuring, Optimizing and Troubleshooting Power-Related Parameters in Electronics Systems was published by McGraw-Hill in 2014. Steve founded AEi Systems, a well-established leader in worst case circuit analysis and troubleshooting of high reliability systems.

Seifert, Charles

Title: Senior Manager, Product Management

Company: Keysight Technologies

Charles Seifert is responsible for Keysight’s, Ixia Solutions Group Ethernet data communications test and measurement hardware systems from 10Mbps to 400GE. Charles has worked in Ethernet test and measurement since the year 2000 specializing in high-speed Ethernet (HSE), high-scale testing, multi-vendor interoperability, and ultra-low latency Layer-2/3 switch test systems. As a participating member of the 10 Gigabit Ethernet Alliance (10GEA), Ethernet Alliance, and UNH-IOL HSE plug fests Charles has worked continuously to improve the interoperability of HSE across the industry. Prior to entering the telecommunications industry, Charles spent over twenty years advancing test and measurement in the semiconductor and microelectronics manufacturing industries.

Steve Sekel

Title: 400G/800G Solutions Specialist

Company: Keysight Technologies

Steve Sekel is currently the 400G/800G solutions specialist in the Internet Infrastructure planning team within the Communications solutions Group at Keysight Technologies. In this role, he guides the requirements definition for solutions and solution components used for characterization and compliance testing of everything within the data center ecosystem involving '400G class' and next generation 800G optical and electrical links. Steve currently represents Keysight in the CEI (Common Electrical I/O) project working groups within the Optical Internetworking Forum as well as the 802.3ck,802.3cm and 802.3cn high speed Ethernet working groups. In the past he has made similar contributions within the 32G and 64G Fibre Channel physical layer standard working group. In OIF Steve also chairs the Physical and Link Layer Interoperability working group.

Slater, Stephen

Title: High-Speed Digital Simulation Product Manager

Company: Keysight Technologies

Stephen Slater leads the signal integrity and power integrity product planning and marketing team at Keysight EEsof EDA. Over the last decade, Stephen has worked closely with customers using Keysight’s Advanced Design System, for high-speed SERDES channel simulations, DDR simulation, and electromagnetic simulation for PCB applications. Before joining Keysight, Stephen graduated from Griffith University, Australia with a B.S. in Electronic Engineering (First Class Honors), and a B.S. in Information Technology.

Sleigh, Rob

Title: Strategic Product Planner

Company: Keysight Technologies

Robert Sleigh is a Product Manager for sampling scope solutions in Keysight Technologies' Network and Data Center organization. His responsibilities include product development of pulse amplitude modulation 4-Level (PAM-4) test solutions based on Keysight’s high-speed electrical and optical digital communications analyzer (DCA). Robert's experience at Keysight Technologies/Agilent Technologies/Hewlett-Packard includes 5 years in technical support and over 12 years in technical marketing. Prior to working at Keysight, Robert worked for 10 years at Westel Telecommunications in Vancouver, British Columbia, Canada, designing microwave and optical telecommunication networks. Rob earned his B.S.E.E. degree from the University of Victoria.

Wang Lee, Chun-ting "Tim"

Title: Application Engineer for High Speed Digital Applications in the EEsof EDA Group

Company: Keysight Technologies

Chun-ting "Tim" Wang Lee is an Application Engineer for High Speed Digital applications in the EEsof EDA Group of Keysight Technologies. Wang Lee received his BSEE degrees from University of Illinois at Urbana Champaign and MSEE from University of Colorado at Boulder. He is currently a Ph.D candidate focusing on signal integrity research in the Electric Engineering Department at the University of Colorado. In the past years, he has given talks in DesignCon and involved himself with signal integrity projects focusing on improving simulation and measurement correlation.