Early Bird Registration Now Open till November 30th. Save Up to $300 Today!


DesignCon 2019 Presentation Viewer

Welcome to the DesignCon Presentation Store. Here you can view and download conference and/or show floor theater presentations before, during, and after the event. If you’re looking for a presentation from a specific session that you’re unable to find here, note that it’s likely because the presenter has not provided permission for external use or has not yet shared their presentation with us. Please check back after the event for a more complete catalogue of available presentations.

Characterization of Signal Integrity Using S-parameters

Neil Jarvis ( RF and Microwave Applications Engineer, Rohde & Schwarz)

Location: Great America 2

Date: Wednesday, January 30

Time: 2:50pm - 3:30pm

Track: Sponsored Sessions

Session Type: Sponsored Session

Vault Recording: TBD

Rohde & Schwarz

Failures during product qualification testing can be time consuming to debug. Understanding simple testing methodologies go a long way towards minimizing these risks. This session will review common SI characteristics such as insertion loss or attenuation, delay, reflections, crosstalk, and differential to common mode conversion. These characteristics will be described and characterized with mixed mode S-parameters using a vector network analyzer.