Early Bird Registration Now Open till November 30th. Save Up to $300 Today!


DesignCon 2019 Presentation Viewer

Welcome to the DesignCon Presentation Store. Here you can view and download conference and/or show floor theater presentations before, during, and after the event. If you’re looking for a presentation from a specific session that you’re unable to find here, note that it’s likely because the presenter has not provided permission for external use or has not yet shared their presentation with us. Please check back after the event for a more complete catalogue of available presentations.

400G PAM4 BER Test Solution (IEEE, OIF/CEI, IBTA): 64Gbaud PAM4 Generation, 32Gbaud PAM4 BER and JTOL Test

Hiroshi Goto (Product Manager and Business Development Manager, Anritsu)

Location: Great America 2

Date: Thursday, January 31

Time: 2:00pm - 2:40pm

Track: Sponsored Sessions

Session Type: Sponsored Session

Vault Recording: TBD

Anritsu

Data center traffic is growing explosively with the spread of cloud networking services. As a result, new high-speed standards (IEEE, OIF-CEI, IBTA) adapted PAM4 as a means for speeding up processing and communications between servers and networks to increase transfer speeds without raising symbol rates. This seminar specifically focuses on the Bit Error Rate (BER) analysis and receiver jitter tolerance test of PAM4 signals and components at 200/400G. An actual 64G PAM4 BER test procedure and test data will be shown, with a discussion on the challenges of PAM4 BER measurements and how to overcome them.