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Location: Ballroom E
Date: Thursday, January 30
Time: 11:00am - 11:45am
Track: 06. System Co-Design: Modeling, Simulation & Measurement Validation
Format: Technical Session
Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass - Get your pass now!
Vault Recording: TBD
Audience Level: All
Typical analog design verification systems do not include test environments in simulation, leading to greater possibilities of device failure. There is an immediate need for a system where device (DUT), HIB (Hardware Interface Board) and ATE (Automatic Test Equipment) could be simulated in a familiar design environment seamlessly. This paper proposes the methodology to bring the HIB components and connectivity to design environment and perform top level system verification of HIB and DUT together before an ATE hardware tape out. Citing two practical use cases, key benefits include overall reduction in test hardware development cycle and flexibility between choosing only a functional verification and a full custom sanity.
Methodology to bring the HIB components and connectivity to pre-silicon design environment; Top level system verification of HIB and DUT together before an ATE hardware tape out.