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A parametric approach to jitter measurement

Mike Schnecker  (Business Development Manager, Rohde & Schwarz USA, Inc)

Location: Great America 2

Date: Wednesday, January 29

Time: 2:50pm - 3:30pm

Track: Sponsored Session

Vault Recording: TBD

Rohde & Schwarz USA, Inc.

Current jitter measurement methods concentrate on analyzing the signal threshold crossing times to determine total jitter as well as all of its component parts. This presentation will detail a new method for measuring one of the most critical parameters; data dependent jitter (DDj) using an approach that uses the full measured waveform to construct the channel rise time from which the DDj can be measured and then isolated in order to measure the remaining jitter components. The method benefits from a large sample size since all of the digitized waveform is used and not just the crossing times. In addition, there is no need to insert “virtual” edges into the TIE measurement eliminating a potential source of error.