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A Review of Combiner/Divider PCB Design Topologies For 5G & WiGig ATE Applications

Jose Moreira (Senior Staff Engineer, Advantest)

Giovanni Bianchi (R&D Engineer, Advantest)

Alexander Quint (Student, Kalrsruhe Institute für Technologie)

Location: Ballroom D

Date: Wednesday, January 30

Time: 2:00pm - 2:40pm

Track: 03. Integrating Photonics & Wireless in Electrical Design

Session Type: Technical Session

Vault Recording: TBD

Audience Level: All

This presentation addresses the challenges of designing PCB test fixtures for automated test equipment (ATE) for mmwave application intended for consumer applications like 5G and WiGig. We will concentrate on the challenges of designing and implementing combiners dividers that can aggregate the large number of mmwave ports in these applications to reduce the cost of test. The challenges are the very high frequencies and the fact that ATE PCB test fixtures present new challenges compared to the traditional way mmwave PCB structures are implemented.


challenges on mmwave design for large ATE PCB test fixtures to address 5G and WiGig applications, What are the possible combiner/divider topologies one can use, what are the implementation challenges. What are the differences with traditional techniques used on mmwave design in the last decades.

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