DesignCon is part of the Informa Markets Division of Informa PLC

This site is operated by a business or businesses owned by Informa PLC and all copyright resides with them. Informa PLC's registered office is 5 Howick Place, London SW1P 1WG. Registered in England and Wales. Number 8860726.

Early Bird Registration Now Open till November 30th. Save Up to $300 Today!

DesignCon 2019 Presentation Viewer

Purchase procecdings

Welcome to the DesignCon Presentation Store. Here you can view and download conference and/or show floor theater presentations before, during, and after the event. If you’re looking for a presentation from a specific session that you’re unable to find here, note that it’s likely because the presenter has not provided permission for external use or has not yet shared their presentation with us. Please check back after the event for a more complete catalogue of available presentations.

If you’d like to do a bulk download of all conference presentations or technical papers at once, please click here for conference presentations or click here for full technical papers. For sessions not included in the main conference, click here for Chiphead Theater presentations or click here for sponsored session presentations.

A Statistical Based Approach to Pre-qualify Optical Modules for Radiated Emission Testing

Jing Li (EMC Design Engineer, Juniper Networks)

Philippe Sochoux (EMC Design Sr. Manager, Juniper Networks)

Wei Zhang (Intern, Juniper Networks)

David Pommerenke (Professor, Missiouri University of Science and Technology)

Location: Ballroom D

Date: Thursday, January 31

Time: 8:00am - 8:45am

Track: 12. Electromagnetic Compatibility/Mitigating Interference

Session Type: Technical Session

Vault Recording: TBD

Audience Level: All

Meeting regulatory radiated emission (RE) for new optics is challenging when tens or hundreds of them are tested in a networking system. When new optics fail RE testing in late design cycle, it becomes very costly to retrofit the optics to make them compliant. This paper proposes a novel technique to quickly qualify a new optical module prior to system level testing using measurements in a reverberation chamber and statistical analysis/hypothesis testing. This fast pre-screening technique would allow for more predictable testing schedules, reduce testing costs, and improve the EMC quality of optics in the early stages of their design.


Early system level testing with new optical modules is often not possible due to their high costs and limited availability, contributing to overall schedule uncertainty should the optics fail radiated emissions. A statistics based methodology to qualify modules based on measurements in a reverberation chamber and hypothesis testing is proposed.

Intended Audience

Audience is to all, not advanced audience levels.

Presentation Files