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A Statistical Based Approach to Pre-qualify Optical Modules for Radiated Emission Testing

Jing Li (EMC Design Engineer, Juniper Networks)

Philippe Sochoux (EMC Design Sr. Manager, Juniper Networks)

Wei Zhang (Intern, Juniper Networks)

David Pommerenke (Professor, Missiouri University of Science and Technology)

Location: Ballroom D

Date: Thursday, January 31

Time: 8:00am - 8:45am

Track: 12. Electromagnetic Compatibility/Mitigating Interference

Session Type: Technical Session

Vault Recording: TBD

Audience Level: All

Meeting regulatory radiated emission (RE) for new optics is challenging when tens or hundreds of them are tested in a networking system. When new optics fail RE testing in late design cycle, it becomes very costly to retrofit the optics to make them compliant. This paper proposes a novel technique to quickly qualify a new optical module prior to system level testing using measurements in a reverberation chamber and statistical analysis/hypothesis testing. This fast pre-screening technique would allow for more predictable testing schedules, reduce testing costs, and improve the EMC quality of optics in the early stages of their design.

Takeaway

Early system level testing with new optical modules is often not possible due to their high costs and limited availability, contributing to overall schedule uncertainty should the optics fail radiated emissions. A statistics based methodology to qualify modules based on measurements in a reverberation chamber and hypothesis testing is proposed.

Intended Audience

NA.
Audience is to all, not advanced audience levels.

Presentation Files

SLIDES_12_AStatisticalBasedApproachToPreQualilfy_Sochoux.pdf
PAPER_12_AStatisticalBasedApproach_Sochoux.pdf