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Challenges and solutions for characterizing opto-electronic components in the high-speed data world

Navneet Kataria (Product Marketing Engineer)

Location: Great America 2

Date: Thursday, January 30

Time: 9:05am - 9:45am

Track: Sponsored Session

Vault Recording: TBD

Anritsu

With the advancements in electro-optical communication systems to meet the ever-increasing demands for higher data speeds, coupled with the market moving toward lowering the effective cost per bit per mile, component designers are struggling to keep costs low and still maintain better designs. Optical compon The characterization of opto-electronic (O/E) and electro-optical (E/O) components for photonic high-speed data transmission is critical as these components not only form the building block of the communication systems, but also define the future of high-speed data in various domains of communication. Measuring the responsivity of components (such as PIN diodes, APDs, electro-absorption modulators, and modulated lasers) is crucial in today’s world. On-wafer, electro-optical ROSA/TOSA device characterization will also be very crucial for the next-generation networks to work seamlessly. ent analyzers play a significant role in the testing and debugging of the key components utilized in these systems