DesignCon is part of the Informa Markets Division of Informa PLC

This site is operated by a business or businesses owned by Informa PLC and all copyright resides with them. Informa PLC's registered office is 5 Howick Place, London SW1P 1WG. Registered in England and Wales. Number 8860726.


Welcome to the DesignCon 2020 agenda and presentation download site. Here you can view and download conference and/or Chiphead Theater presentations before, during, and after the event. If you’re looking for a presentation from a specific session that you’re unable to find here, it is likely because the presenter has not provided permission for external use or has not yet shared their presentation with us. Please check back after the event for a more complete catalogue of available presentations.

De-coupled Magnetic & Electric Field Phase Assessment in the Near-Field Zone

Maryna Nesterova (R&D engineer, Aprel)

Location: Ballroom A

Date: Thursday, January 30

Time: 8:00am - 8:45am

Track: 11. Electromagnetic Compatibility/Mitigating Interference, 12. Applying Test & Measurement Methodology

Format: Technical Session

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass - Get your pass now!

Vault Recording: TBD

Audience Level: Intermediate

In the near-field zone of an electronic device the electric and magnetic waves are not synchronized in phase and in vector orientation, so the character of the electromagnetic field is highly inhomogeneous. In areas where de-coupled electric and magnetic waves become synchronised in phase and spatial orientation, an unwanted signal propagating to the far field is formed. In the presented study the phase and vector distributions of de-coupled electric and magnetic fields were measured using E- and H- near-field vector probes. The test results were analysed for phase correlation between electric and magnetic waves.

Takeaway

Evanescent field interference, cross-talk detection, backscattering detection, complex phasors, de-coupled E- and H- fields in the near-field, vector H-probe, vector E-probe, phase shift.