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April 5-7, 2022|Santa Clara Convention Center| Santa Clara, CA
Jinlong Li (SI ENGINEER, ZTE)
Rong Liu (Senior Application Engineer, ANSYS)
Zhongmin Wei (SI ENGINEER, ZTE)
Bi Yi (SI ENGINEER, ZTE)
Yu Bi (SI ENGINEER, ZTE)
Location: Chiphead Theater
Date: Thursday, April 7
Time: 12:25 pm - 12:35 pm
Track: Chiphead Theater, 12. Applying Test & Measurement Methodology
Format: Lightning Talk
Theme : High-speed Communications
Education Level: All
Pass Type: 2-Day Pass, All Access Pass, Expo Pass
Vault Recording: TBD
Audience Level: All
As the modulation mode of 224G signal is not clear yet, the test bandwidth may reach 65GHz or even 84GHz. The test method and test accuracy are of great concern. In order to meet the test requirements of subsequent 224G systems and key modules, it is necessary to study the high bandwidth test scheme and de-embedding method. In this paper, the key factors affecting of 2x through are deeply analyzed, and the consistency constraints between 2x through and fixture are obtained, which is conducive to the design of high bandwidth de-embedding. Secondly, this paper proposes a new SMA footprint and optimizes the simulation model, which greatly improves the simulation accuracy and bandwidth. From the simulation results, its bandwidth can reach more than 67GHz. Finally, a test board is designed, and the simulation is consistent with the test through the comparison of application cases.
1.The consistency constraint between fixture and 2x through and the accuracy of DUT under this constraint are given. 2.Proposes a new SMA footprint which bandwidth can reach more than 67GHz. 3.Proposes a method which use for optimizing the simulation model, so as to improve the simulation accuracy.
Theoretical knowledge of electromagnetic fields; Experience in system interconnection; Experience in De-embedding algorithm and principle.