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Anand Raman (Senior Director, Ansys)
Location: Room 203
Date: Thursday, January 30
Time: 2:00pm - 2:40pm
Track: Sponsored Session
Vault Recording: TBD
High speed/frequency RF transceivers and SoCs for 5G, mobile, AI,
automotive and networking applications are becoming increasingly
susceptible to electromagnetic (EM) cross coupling effects. In this session
we will cover how ANSYS on-chip EM solutions can accurately capture all
electromagnetic phenomena for mitigating the risk of electromagnetic
crosstalk induced performance degradation and failure in high-speed, high
frequency and low-power RFICs and SoCs.