Welcome to the DesignCon 2020 agenda and presentation download site. Here you can view and download conference and/or Chiphead Theater presentations before, during, and after the event. If you’re looking for a presentation from a specific session that you’re unable to find here, it is likely because the presenter has not provided permission for external use or has not yet shared their presentation with us. Please check back after the event for a more complete catalogue of available presentations.
Kan Tan (Principal Engineer, Tektronix)
John Pickerd (Principal Engineer, Tektronix)
Pavel Zivny (Domain Expert Engineer, Tektronix)
Maria Agoston (Principal Engineer, Tektronix)
Location: Ballroom G
Date: Thursday, January 30
Time: 8:00am - 8:45am
Track: 12. Applying Test & Measurement Methodology, 08. Measurement, Simulation & Improving Jitter, Noise & BER (Pre & Post FEC)
Format: Technical Session
Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass - Get your pass now!
Vault Recording: TBD
Audience Level: Intermediate
The high speed PAM4 signals with repeating data pattern can be analyzed and measured on the equivalent-time sampling oscilloscopes. The harmonics not synchronous with the data pattern are aliased. The aliasing is analyzed, and a method is described to remove the unwanted aliased harmonics.The real-time oscilloscopes have the real-time sample rate high enough to prevent aliasing. A numerical example is given that compares the TDECQ measurement on the sampling scope and on the real-time scopes.
When comparing the measurement results between equivalent time sampling oscilloscopes and real-time oscilloscopes, it is required to consider that the components not correlated to data pattern can be aliased on the equivalent time sampling scope. Appropriate steps can be taken to improve the correlation between the two types of oscilloscopes.