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Exploring 56/112-Gbps Copper Interconnect Metrics Comparing Classic Methods with COM

David Brunker (Technical Fellow, Molex)

Chris Roth (Signal Integrity Engineer, Molex)

Mike Resso (Signal Integrity Applications Scientist, Keysight)

Robert Schaefer (R&D Project Manager, Keysight)

OJ Danzy (Signal Integrity Engineer, Keysight)

Brent Hatfield (New Product Development Manager, Molex)

Joe Dambach (New Product Development Manager, Molex)

Michael Rost (Engineering Manager SI, Molex)

Vivek Shah (Global Engineering Director SI, Molex)

Location: Ballroom C

Date: Wednesday, January 30

Time: 2:00pm - 2:40pm

Track: 14. Modeling & Analysis of Interconnects, 08. Optimizing High-Speed Serial Design

Session Type: Technical Session

Vault Recording: TBD

Audience Level: All

As the Datacomm Industry focus moves on from 25G-NRZ to 56/112G-PAM4, the complex nature of the solution space encountered with advanced high speed signaling may not be fully mapped using Classic signal-in-noise detection parameters. A more refined solution topology is explored through the addition of COM analysis.

Deliverables of this study will include full channel assessments using Classic and COM tools with a map of their performance intersection. These performance studies will be conducted at 56G and 112G-PAM4 data rates. Best-fit regression plots will be shared to view Classic to COM agreement as well as Eye Mask and BER Verification Testing.


Advanced high-speed copper signaling is moving up to 56/112G-PAM4 data rates. The solution space encountered with 56/112G-PAM4 signaling may not be fully mapped using Classic signal-in-noise metrics. A more refined solution topology is explored through the addition of COM analysis and best-fit regression plots.

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