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Youngwoo Kim (Assistant Professor, NAIST)
Location: Ballroom E
Date: Wednesday, January 29
Time: 2:50pm - 3:30pm
Track: 11. Electromagnetic Compatibility/Mitigating Interference, 10. Power Integrity in Power Distribution Networks
Format: Technical Session
Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass - Get your pass now!
Vault Recording: TBD
Audience Level: All
In this paper, we analyze hardware security issues associated with information leakage, low-power IEMI and power/ground noise and provide possible solution. We apply low-power IEMI noise to the PDN of side-channel attack standard evaluation board (SASEBO). The amplitude of IEMI source is smaller than the limit which can damage the IC, but cause bit errors. We propose simulation set-up which can estimate bit errors depending on external IEMI noise, power/ground noise and validate with measured result. Using the proposed simulation method, we estimate bit errors and information leakage depending on various EM attack scenario and propose possible solutions.
In this paper, we analyze hardware security and information leakage issues associated with low-power IEMI and power/ground noise and provide possible solution. We apply various IEMI noises to PDN of side-channel attack standard evaluation board and monitor power/ground noise and bit errors. Then, possible solutions toward these issues are provided.