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How the Braid Impedance of Instrumentation Cables Impact PI & SI Measurements

Jim Nadolny (Engineering Manager, Samtec)

Istvan Novak (Samtec)

Ethan Koether (Hardware Engineer, Oracle)

Gary Biddle (SI Engineer, Samtec)

Location: Ballroom G

Date: Thursday, January 31

Time: 11:00am - 11:45am

Track: 13. Applying Test & Measurement Methodology, 12. Electromagnetic Compatibility/Mitigating Interference

Session Type: Technical Session

Vault Recording: TBD

Audience Level: Intermediate

VNA instrumentation cables have a direct impact on low frequency, high dynamic range measurements. In this paper we explain this phenomena in the context of power integrity measurements. DC resistance and low frequency transfer impedance are relevant cable metrics which are shown to correlate with the measurement dynamic range.


1. An appreciation for typical errors in PI measurements
2. An appreciation that VNA cable shielding matters for low frequency, wide dynamic range applications
3. An understanding of transfer impedance and it's impact on S-parameter measurements.

Intended Audience

To get the most out of this presentation the audience should have some appreciation for the challenges of high isolation, low frequency (100+ dB, 10 KHz) VNA measurements. The math used to describe cable transfer impedance is algebraic, so not overly technical. Familiarity with PI and PI measurements is helpful.

Presentation Files