April 5-7, 2022|Santa Clara Convention Center| Santa Clara, CA
Speakers:
Zhaoyin Daniel Wu (Principal Engineer, AMD)
Chuan Xie (Principal Engineer, AMD)
Mayank Raj (Senior Design Manager, AMD)
Parag Upadhyaya (Director of Engineering, AMD)
Hongtao Zhang (Principal Engineer, AMD)
Yohan Frans (VP of Engineering, AMD)
Geoff Zhang (Distinguished Engineer, AMD)
Location: Ballroom G
Date: Wednesday, April 6
Time: 2:00 pm - 2:45 pm
Track: 03. Integrating Photonics & Wireless in Electrical Design, 06. System Co-Design: Modeling, Simulation & Measurement Validation
Format: Technical Session
Theme : High-speed Communications
Education Level: All
Pass Type: 2-Day Pass, All Access Pass
Vault Recording: TBD
Audience Level: All
In a modern WDM (Wavelength-Division Multiplexer) transceiver, both optical-domain and electrical-domain cross-talks are generally playing important roles to impact the transceiver performance. While electrical-domain cross-talk is better known by a signal-integrity (SI) engineer, this paper will address the optical-domain one. It will first identify the sources of interferences and cross-talks introduced in the WDM channels of a silicon photonic chip, which includes Relative Intensity Noise (RIN) from the adjacent channels, laser carrier interference due to non-ideal wavelength multiplexer/de-multiplexer, and residual signal from the adjacent channel due to non-ideal channel selection filter and photo-detector direct demodulation. All the cross-talks or interferences will be elaborated in terms of their coupling mechanism and their impacts on a high performance SerDes transceiver. In addition, a modeling and simulating approach will be proposed and demonstrated to accurately evaluate their impacts on transceiver's end-to-end simulation.
The audience will first get the root causes of each optical-domain cross-talk and interferences, and then know how to analyze the impacts of each cross-talk. This is especially important when considering low-power silicon-photonic design with variations of PVT and wavelengths of laser sources.