DesignCon 2022 Schedule Builder

Traditional de-embedding methods can give non-causal error in device-under-test (DUT) results if the test fixture and calibration structure have different impedance. This presentation introduces In-Situ De-embedding (ISD) that pioneered impedance corrected de-embedding to address such impedance difference through software instead of hardware, thereby improving de-embedding accuracy while reducing hardware cost. The topics will include an automated inter-pair de-embedding and ccICN calculation for PCIe 5.0 CEM compliance testing. Also, recent enhancements to give accurate de-embedding beyond the frequency where fixture insertion and return loss cross over. The presentation will feature 50+ GHz measurement examples.