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Lightning Talk – Testing Power Supply Noise Rejection in Differential Oscillators

Michael Arkin (Product Marketing Manager, Epson America, Inc.)

Neil Jarvis (Applications Engineer, Rohde & Schwarz)

Location: Chiphead Theater

Date: Wednesday, January 29

Time: 3:45pm - 3:55pm

Track: Chiphead Theater, 12. Applying Test & Measurement Methodology

Format: Lightning Talk

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass, Boot Camp Pass, Expo Pass - Get your pass now!

Vault Recording: TBD

Audience Level: All

Lightning Talks are technical papers that were accepted as part of the DesignCon conference, but are being made available to all attendees as short sessions in the Chiphead Theater.

Paper description: Jitter negatively impacts the Bit-Error-Rate in a digital communication system. Component manufacturers generally only measure the oscillator's jitter under ideal conditions for product specifications. When applied to actual systems, jitter is often higher than the specified components' jitter due to noise sources such as power supply noise that are intentionally minimized in a laboratory environment.
The lack of specifications related to external sources makes it difficult to select the best oscillator from just a datasheet. This paper will propose measurement techniques to quantify power supply noise's contribution to jitter using commonly available test and measurement equipment.

Takeaway

1. Datasheet specifications are measured in a noise-free environment and do not include noise sources like power supply noise, so customers cannot easily compare competitive offerings
2. Measuring Power Supply Noise Rejection can be used to make better product choices using test and measurement equipment they may already have

Intended Audience

Engineers with experience designing digital communication channels where timing jitter is a limiting factor in reaching targeted data rates at required Bit-Error-Rates