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April 5-7, 2022|Santa Clara Convention Center| Santa Clara, CA
Seungtaek Jeong (Post-doctoral Fellow, Missouri S&T)
Hwanwoo Shim (Principal Engineer, Samsung Electronics)
Seyoon Cheon (Engineer, Samsung Electronics)
Myeonghwan Kim (Senior Engineer, Samsung Electronics)
Chulsoon Hwang (Assistant Professor, Missouri S&T)
Location: Ballroom E
Date: Wednesday, April 6
Time: 12:15 pm - 1:00 pm
Track: 11. Electromagnetic Compatibility & Interference, 13. Modeling & Analysis of Interconnects
Format: Technical Session
Theme : Consumer Electronics, High-speed Communications
Education Level: All
Pass Type: 2-Day Pass, All Access Pass
Vault Recording: TBD
Audience Level: All
Noise coupling paths in a complex electronic system are not often intuitive, making it hard to rely on intuition or educated guess due to the complexity of the system. While the Poynting vector method has been widely used to trace the power flow, coupling problems are fundamentally different from the radiation problems and the Poynting vector method cannot not be applied. In this paper, a coupling path visualization technique is proposed for fast and systematic troubleshooting of coupling problems in a complex electronic system. Electric and magnetic fields from two full wave simulations, called forward problem and backward problem, are combined based on the proposed equation. A coupling coefficient representing normalized coupled power is used to represent the coupling. Due to the limited capability of commercial EM tools to visualize field vectors, the fields are post-processed and visualized (with a 3D-CAD model) in MATLAB. The proposed method is validated with the coupling suppressed when the identified dominant coupling path is blocked in a practical smartphone.
A noise coupling path visualization technique is proposed for efficient and fast troubleshooting in complex electronic systems. The simulated fields from a 3D-EM simulation tool are post-processed to visualize the coupling from an aggressor to a victim based on derived expressions. The method is successfully verified in a practical smartphone.