April 5-7, 2022|Santa Clara Convention Center| Santa Clara, CA
Moderator:
Heidi Barnes (SI and PI Applications Engineer, Keysight Technologies)
Panelists:
Istvan Novak (Power Integrity Engineer, Samtec)
Steve Sandler (Founder, Picotest.com)
Jim DeLap (Electronics Product Manager, ANSYS)
Joe Hock (Chief Scientist, R&D, Kyocera - AVX)
Eric Bogatin (Professor, University of Colorado, Boulder)
Location: Ballroom H
Date: Wednesday, April 6
Time: 4:00 pm - 5:15 pm
Track: 10. Power Integrity in Power Distribution Networks, 12. Applying Test & Measurement Methodology
Format: Panel Discussion
Theme : Automotive, Data Centers
Education Level: All
Pass Type: 2-Day Pass, All Access Pass, Expo Pass
Vault Recording: TBD
Audience Level: All
Join some of DesignCon's top speakers and industry experts for a lively and controversial panel discussion on passive component models for power integrity simulations. Learn why not everyone agrees on how to measure them, how to model them, and how they should be used in the simulators.
Topics for Discussion:
• Are vendor models always wrong?
• Where is the standard for measuring and modeling passive components?
• Power delivery is not DC! EM simulators are the only way to get it right. Right?
• Avoid decade caps and free SPICE when designing power delivery with GaN?
• Do Ferrite Beads belong in Power Integrity?
Models should always be verified; acceptable measurement practices for low impedance components; importance of EM models for PCB parasitics; why leveraging ferrite beads and decade caps from older designs may no longer work.
No prerequisites required, but recommend some familiarity with power integrity, R-L-C and s-parameter component models.