April 5-7, 2022|Santa Clara Convention Center| Santa Clara, CA

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Panel – Test on Wheels: Test & Measurement for Automotive Standards


Julien Henaut  (COO / R&D Manager, BitifEye Digital Test Solutions GmbH)


Edo Cohen  (VP Ecosystem Development, Valens)

Ajeya Gupta  (Research Engineer – Advanced Networking Systems, Ford Motor Company)

Kevin Kershner  (Solution Architect for in-vehicle network test, Keysight Technologies)

Dr. Kirsten Matheus  (Develpoment Engineer, BMW Group)

Laxman Vemury  (General Manager for Wireline Business Unit, Analog Devices)

Shawn Prestridge  (Senior FAE / US FAE Team Leader, IAR Systems)

Location: Ballroom C

Date: Thursday, April 7

Time: 4:00 pm - 5:15 pm

Track: Drive World - Advanced Automotive, 07. Optimizing High-Speed Link Design

Format: Panel Discussion

Theme : Automotive

Education Level: All

Pass Type: 2-Day Pass, All Access Pass, Expo Pass

Vault Recording: TBD

Audience Level: All

The Test on wheels panel brings together DesignCon and DriveWorld by examining the changes sweeping automotive technology and their signal integrity challenges. New, bandwidth-starved applications – driver assistance and self-driving tech, sensors and high-resolution displays, safety improvements, and smart cities – demand new standards with data rates far beyond anything ever attempted in the hostile automotive environment.

Bring your ideas, concerns, and questions to our panel of DesignCon experts from Analog Devices, BitifEye, Keysight, and Valens Semiconductor plus car manufacturer with BMW and Ford and automotive authorities from DriveWorld, ready to discuss and argue about electronics in the automotive physical layer from application to chipset, PCB design to highway.


Understand the unique challenges of high-speed data interconnection in automotive applications and how the standards are addressing them.

Intended Audience

general familiarity with high speed I/O and signal integrity