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Location: Ballroom C
Date: Wednesday, January 29
Time: 12:00pm - 12:45pm
Track: 12. Applying Test & Measurement Methodology, 13. Modeling & Analysis of Interconnects
Format: Technical Session
Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass - Get your pass now!
Vault Recording: TBD
Audience Level: All
In this article we will expand the usefulness of an already useful de-embedding technology to extract material properties with just one measurement. The output is DK, effective DF, and potentially effective surface roughness. This methodology is useful when evaluating test vehicles and de-bugging unusual results. An example study is shown to prove the method's validity and how this technique is useful for the day-to-day SI engineer.
The audience will have an understanding of how to use de-embedding technology to extract PCB material properties with one measurement and will be exposed to Kramer-Kronig applications.
Know what a PCB is, and exposure to S-parameter measurements using a VNA.