DesignCon is part of the Informa Markets Division of Informa PLC

This site is operated by a business or businesses owned by Informa PLC and all copyright resides with them. Informa PLC's registered office is 5 Howick Place, London SW1P 1WG. Registered in England and Wales. Number 8860726.

Welcome to the DesignCon 2020 agenda and presentation download site. Here you can view and download conference and/or Chiphead Theater presentations before, during, and after the event. If you’re looking for a presentation from a specific session that you’re unable to find here, it is likely because the presenter has not provided permission for external use or has not yet shared their presentation with us. Please check back after the event for a more complete catalogue of available presentations.

PCB Material Characterization with One Measurement!

Jason Ellison  (Senior Staff Signal Integrity Engineer, Amphenol)

Michael Rowlands  (Signal Integrity Engineer, Amphenol)

Location: Ballroom C

Date: Wednesday, January 29

Time: 12:00pm - 12:45pm

Track: 12. Applying Test & Measurement Methodology, 13. Modeling & Analysis of Interconnects

Format: Technical Session

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass - Get your pass now!

Vault Recording: TBD

Audience Level: All

In this article we will expand the usefulness of an already useful de-embedding technology to extract material properties with just one measurement. The output is DK, effective DF, and potentially effective surface roughness. This methodology is useful when evaluating test vehicles and de-bugging unusual results. An example study is shown to prove the method's validity and how this technique is useful for the day-to-day SI engineer.


The audience will have an understanding of how to use de-embedding technology to extract PCB material properties with one measurement and will be exposed to Kramer-Kronig applications.

Intended Audience

Know what a PCB is, and exposure to S-parameter measurements using a VNA.

Presentation Files