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PCB Material Characterization with One Measurement!

Jason Ellison (Senior Staff Signal Integrity Engineer, Amphenol)

Michael Rowlands (Signal Integrity Engineer, Amphenol)

Location: Ballroom C

Date: Wednesday, January 29

Time: 9:00am - 9:45am

Track: 12. Applying Test & Measurement Methodology, 13. Modeling & Analysis of Interconnects

Format: Technical Session

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass - Get your pass now!

Vault Recording: TBD

Audience Level: All

In this article we will expand the usefulness of an already useful de-embedding technology to extract material properties with just one measurement. The output is DK, effective DF, and potentially effective surface roughness. This methodology is useful when evaluating test vehicles and de-bugging unusual results. An example study is shown to prove the method's validity and how this technique is useful for the day-to-day SI engineer.

Takeaway

The audience will have an understanding of how to use de-embedding technology to extract PCB material properties with one measurement and will be exposed to Kramer-Kronig applications.

Intended Audience

Know what a PCB is, and exposure to S-parameter measurements using a VNA.