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Sayed Mobin (Director, Hardware Development Engineering, Western Digital)
Venkatesh Ramachandra (Director, Western Digital)
Pranav Balachander (Staff Engineer (SIPI Hardware Development Engineering), Western Digital)
Jiwang Lee (Staff Design Engineer)
Chau D. Nguyen (Electrical Engineer, Western Digital)
Asha Sharma (Manager, Electronic Design, Western Digital)
Location: Ballroom B
Date: Wednesday, January 29
Time: 2:50 pm - 3:30 pm
Track: 05. Advanced I/O Interface Design for Memory & 2.5D/3D/SiP Integrations, 10. Power Integrity in Power Distribution Networks
Format: Technical Session
Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass - Get your pass now!
Vault Recording: TBD
Audience Level: Intermediate
The Power Delivery Network (PDN) of the NAND Flash silicon characterization environment contributes significant random jitter in NAND clock signals (DQS/BDQS) duty cycles. The specification values for the clock pulse width is used in signal integrity (SI) simulation, include both the average duty cycle distortion and the typical duty-cycle jitter. PDN also contributes random jitter in the data lines resulting in bit to bit skew within a byte. This paper identifies PDN jitter impact on the critical NAND AC timing parameters and describes how to correctly implement NAND AC timing parameter specifications for more accurate system level performance prediction.
Will address following two Questions
1) It is established that RE DCD needs to be included in SI Simulation, Why do we need to modify the proposed method?
2) NAND AC timing parameters are determined through a standard process, why do we need to make adjustment to the spec values during system level analysis?
Understanding of Basic Transmission line theory, Power Distribution Network, Jitter concept, Characterization environment, Basic NAND Flash memory Interface