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Practical Implementation of Testing 50-Gbps per Lane Effective Return Loss (ERL)

Christopher DiMinico (President/CTO, MC Communications)

Curtis Donahue ( Senior Manager, UNH-IOL)

O.J. Danzy (Senior RF and Microwave Application Engineer , Keysight Technologies)

Richard Mellitz (Distinguished Engineer , Samtec)

Mike Resso (Signal Integrity Application Scientist, Keysight Technologies)

Mike Sapozhnikov (Signal Integrity Manager, Cisco Systems)

Mike Klempa (Lead Engineer, UNH-IOL)

Adee Ran (Principal Engineer, Intel)

Location: Ballroom C

Date: Thursday, January 31

Time: 8:00am - 8:45am

Track: 13. Applying Test & Measurement Methodology, 14. Modeling & Analysis of Interconnects

Session Type: Technical Session

Vault Recording: TBD

Audience Level: Intermediate

The paper is to provide a detailed analysis of the relationship between the return loss of the channel, its components, and the channel operating margin (COM) results supporting the introduction of effective return loss (ERL) for the IEEE 802.3cd 50 Gb/s lane standard. ERL is characterized as a figure of merit for the electromagnetic wave reflection from a device or a channel input or output It is calculated using the a method described in the draft standard. The paper will provide practical examples of implementing the ERL method for transmitters, receivers, and cable assemblies by measurements of their scattering parameters.

Presentation Files

SLIDES_13_PracticalImplementationofTesting50Gbs_DiMinico.pdf
PAPER_13_PracticalimplementationofTesting50Gbs_DiMinico.pdf