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Licheng Wu (Hardware Systems Engineer, NXP Semiconductors)
Location: Ballroom A
Date: Wednesday, January 29
Time: 11:00am - 11:45am
Track: 01. Signal & Power Integrity for Single-Multi Die, Interposer & Packaging
Format: Technical Session
Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass - Get your pass now!
Vault Recording: TBD
Audience Level: All
This paper proposes a method to analyze and predict the power supply induced jitter (PSIJ) on data eye caused by both PHY core supply and I/O supply in a DDR interface. Apart from predicting power supply induced edge TIE jitter of an individual data signal using extracted jitter sensitivity and power noise profile, the impact of jitter tracking effect and edge slope modulation on final data eye jitter is also considered by developing an analytical model. The accuracy of predicted data eye jitter is verified by measurements in an LPDDR4-3000 interface. An overall error of less than 20% is observed.
A method to predict power supply induced data eye jitter in DDR interfaces, which considers the impact of jitter tracking and edge slope modulation, allowing the predicted jitter number to be directly used in DDR interface timing calculation.