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Preparing to Test USB 3.2 and Next-gen Type-C Technologies

Jit Lim (Standards and Solutions Lead for USB and Thunderbolt, Keysight Technologies)

Location: Great America 1

Date: Wednesday, January 30

Time: 10:15am - 10:55am

Track: Sponsored Sessions

Session Type: Sponsored Session

Vault Recording: TBD

Audience Level: Intermediate

Keysight Technologies

The USB Type-C connector has significant adoption with standards like USB, Thunderbolt, DP, and HDMI utilizing this connector.
This session will review requirements for testing USB 3.2 and next-gen Type-C technologies. As faster signals get sent through more Type-C wires and longer cables, new measurement techniques are required to test repeaters, active cables, and also comprehend crosstalk. We will review these new measurement solutions and ultra-low noise test instruments required to properly characterize these next-gen signals.
NOTE: USB Type-C™ and USB-C™ are trademarks of USB Implementers Forum.
ThunderboltTM and the Thunderbolt logo are trademarks of Intel Corporation or its subsidiaries in the U.S. and/or other countries.