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Welcome to the DesignCon 2020 agenda and presentation download site. Here you can view and download conference and/or Chiphead Theater presentations before, during, and after the event. If you’re looking for a presentation from a specific session that you’re unable to find here, it is likely because the presenter has not provided permission for external use or has not yet shared their presentation with us. Please check back after the event for a more complete catalogue of available presentations.

Rapid Characterization of High Speed Digital Channels using a Multiport VNA

Ryan Letcher  (President & RF Engineer, RCL Microwave)

Location: Great America 2

Date: Wednesday, January 29

Time: 12:05pm - 12:45pm

Track: Sponsored Session

Vault Recording: TBD

Rohde & Schwarz USA, Inc.

Vector Network Analyzers (VNA) are gaining popularity in the Signal Integrity community as time domain measurement and analysis tools. VNAs with 8 ports or more can provide significant decreases in test time by migrating from a 4-port measurement system to an 8-port measurement system. For tight tolerance DUTs that are barely within the test limit lines, small increases in accuracy can be realized by testing all of the test parameters at once, because the entire test setup is at the same temperature. This presentation discusses the thermal advantages of testing an 8-port DUT with the R&S ZNBT VNA. The use of the ZNBT to assess and debug two differential pairs in a 20-inch backplane is presented.