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S-Parameter Measurement & Fixture De-Embedding Variation Across Multiple Teams, Equipment & De-embedding Tools

Jose Moreira (Senior Staff Engineer, Advantest)

Heidi Barnes (Senior Application Engineer, Keysight Technologies)

Jason Ellison (Sr. Staff Signal Integrity Engineer, Amphenol)

Jim Nadolny (NA, Samtec)

Al Neves (CTO, Wild River Technology)

Ching-Chao Huang (President, Ataitec)

Eric Bogatin (Dean, Teledyne LeCroy Signal Integrity Academy)

Patrick Murray (Field Application Engineer, Anritsu)

Mikheil Tsiklauri (Research Associate Professor, EMC Laboratory, Missouri University of Science and Technology)

Neil Jarvis (Applications Engineer, Rohde & Schwarz)

Location: Ballroom D

Date: Wednesday, January 30

Time: 11:00am - 11:45am

Track: 13. Applying Test & Measurement Methodology

Session Type: Technical Session

Vault Recording: TBD

Audience Level: All

S-parameter measurement and fixture de-embedding are critical tasks especially when measurements and models are shared across multiple teams. In this session we will present a review of best practices for VNA measurements and fixture de-embedding. We will also present the results of a study performed in the context of the IEEE P370 standard analyzing the variation of results across multiple teams for the measurement and fixture de-embedding of the same set of PCB test coupons.


Best practices for the reliable and repeatable measurement of S-parameters with a VNA and fixture de-embedding.

Presentation Files