Welcome to the DesignCon 2020 agenda and presentation download site. Here you can view and download conference and/or Chiphead Theater presentations before, during, and after the event. If you’re looking for a presentation from a specific session that you’re unable to find here, it is likely because the presenter has not provided permission for external use or has not yet shared their presentation with us. Please check back after the event for a more complete catalogue of available presentations.
Mike Resso (Signal Integrity Application Scientist, Keysight Technologies)
Chun-ting "Tim" Wang Lee (Application Engineer for High Speed Digital Applications in the EEsof EDA Group, Keysight Technologies)
Location: Great America 1
Date: Wednesday, January 29
Time: 9:20am - 10:05am
Track: Keysight Education Forum
Vault Recording: TBD
| This presentation helps you improve your understanding of Signal Integrity simulation and measurement correlation by reviewing and re-introducing Beatty Standard test structure. The fabrication process of Printed Circuit Board (PCB) introduces uncertainties in different aspects of the circuit board. By modeling and tuning the PCB properties of Beatty Standard test structure in simulation to match measurement, SI engineers identify the as-fabricated material properties. This presentation first reviews the PCB material property identification process, follows with a new theoretical analysis of Beatty Standard that showcases the versatility and accuracy of the test structure, and concludes with a measurement to simulation workflow for PCB material properties identification. If you are new to signal integrity, this session gives you a comprehensive view of what it takes to achieve simulation and measurement correlation. For experienced SI engineers, this presentation is an excellent review and update on the development of PCB material property identification. |