DesignCon is part of the Informa Markets Division of Informa PLC

This site is operated by a business or businesses owned by Informa PLC and all copyright resides with them. Informa PLC's registered office is 5 Howick Place, London SW1P 1WG. Registered in England and Wales. Number 8860726.


Welcome to the DesignCon 2020 agenda and presentation download site. Here you can view and download conference and/or Chiphead Theater presentations before, during, and after the event. If you’re looking for a presentation from a specific session that you’re unable to find here, it is likely because the presenter has not provided permission for external use or has not yet shared their presentation with us. Please check back after the event for a more complete catalogue of available presentations.

Signal Model-Based Approach to a Joint Jitter & Noise Decomposition

Adrian Ispas (Senior Development Engineer, Rohde & Schwarz)

Julian Leyh (Development Engineer, Rohde & Schwarz)

Andreas Maier (Senior Development Engineer, Rohde & Schwarz)

Bernhard Nitsch (Director, Rohde & Schwarz)

Location: Ballroom A

Date: Wednesday, January 29

Time: 8:00am - 8:45am

Track: 08. Measurement, Simulation & Improving Jitter, Noise & BER (Pre & Post FEC), 12. Applying Test & Measurement Methodology

Format: Technical Session

Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass - Get your pass now!

Vault Recording: TBD

Audience Level: All

We propose a joint jitter and noise analysis framework for serial PAM transmission that is based on a parametric signal model. Our approach has several benefits compared to state-of-the-art methods: First, we provide additional measurements. Second, we require shorter signal lengths for the same accuracy. Finally, our method does not rely on specific symbol sequences. In the paper, we show exemplary measurement results as well as comparisons to state-of-the-art methods.

Takeaway

- New approach for jitter decomposition and BER extrapolation
- Extended set of measurements for in-depth analysis
- Presentation of results using measured waveforms