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Adrian Ispas (Senior Development Engineer, Rohde & Schwarz)
Julian Leyh (Development Engineer, Rohde & Schwarz)
Andreas Maier (Senior Development Engineer, Rohde & Schwarz)
Bernhard Nitsch (Director, Rohde & Schwarz)
Location: Ballroom A
Date: Wednesday, January 29
Time: 8:00am - 8:45am
Track: 08. Measurement, Simulation & Improving Jitter, Noise & BER (Pre & Post FEC), 12. Applying Test & Measurement Methodology
Format: Technical Session
Pass Type: 2-Day Pass, All-Access Pass, Alumni All-Access Pass - Get your pass now!
Vault Recording: TBD
Audience Level: All
We propose a joint jitter and noise analysis framework for serial PAM transmission that is based on a parametric signal model. Our approach has several benefits compared to state-of-the-art methods: First, we provide additional measurements. Second, we require shorter signal lengths for the same accuracy. Finally, our method does not rely on specific symbol sequences. In the paper, we show exemplary measurement results as well as comparisons to state-of-the-art methods.
- New approach for jitter decomposition and BER extrapolation
- Extended set of measurements for in-depth analysis
- Presentation of results using measured waveforms