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DesignCon 2019 Presentation Viewer

Welcome to the DesignCon Presentation Store. Here you can view and download conference and/or show floor theater presentations before, during, and after the event. If you’re looking for a presentation from a specific session that you’re unable to find here, note that it’s likely because the presenter has not provided permission for external use or has not yet shared their presentation with us. Please check back after the event for a more complete catalogue of available presentations.

Simplify & Validate: A Single Structure Approach for Separate PCB Dielectric & Conductor Roughness Loss Characterization

Yasin Damgaci (Signal Integrity Engineer, Hewlett Packard Enterprise)

YongJin Choi (Master Technologist, Hewlett Packard Enterprise)

Christopher Cheng (Distinguished Technologist, Hewlett Packard Enterprise)

Yuriy Shlepnev (President , Simberian Inc.)

Nagaraj Godishala (Master Technologist, Hewlett Packard Enterprise Company)

Location: Ballroom B

Date: Thursday, January 31

Time: 10:00am - 10:45am

Track: 14. Modeling & Analysis of Interconnects

Session Type: Technical Session

Vault Recording: TBD

Audience Level: All

To find out the reasons for possible PCB manufacturing failure due to losses, a new easy-to-use production floor technique with separation of dielectric, conductor and roughness effects is needed. This paper presents a novel method that identifies material properties using just one structure and one TDR/TDT measurement. The post-processing of the measurement extracts the frequency-dependent models for dielectric, conductor, and copper surface roughness. The proposed technique is called XMOT (eXtract and MOnitor PCB material properties using a T-resonator only). It can be used to collect the statistics of the material variations during manufacturing and monitor changes in dielectric and conductor roughness properties.

Takeaway

We are proposing a novel method which identifies material properties and differentiates conductor and dielectric losses using one structure only: asymmetrical T-resonator. This approach requires only one measurement in the time-domain. Just using one structure we can get information on transmission line properties and resonator response at the same time.

Intended Audience

None.