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Test Fixture De-embedding and Material Characterization for 40 GHz Delta-L

Dr. James Drewniak  (Professor)

Location: Great America 2

Date: Wednesday, January 29

Time: 9:05am - 9:45am

Track: Sponsored Session

Vault Recording: TBD

Rohde & Schwarz USA, Inc.

PCB design for signal integrity requires measurement verification, for example, connector interfaces, via transitions, and material characterization. However, the port at which S-parameters are desired are typically at some interior point on the PCB, and removed from the measurement port where cables or probes are located. Consequently, this test fixturing must be de-embedded before using the measured S-parameters for comparison with simulation, in channel analysis, or for material extraction. De-embedding using a 2X Thru approach will be presented, and suitable test fixture development for de-embedding will be discussed. The specific application presented will be PCB material characterization for 40 GHz Delta-L.