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April 5-7, 2022|Santa Clara Convention Center| Santa Clara, CA
Michael Yang (Sr. Product Manager, Anritsu)
Location: Mission City Ballroom B5
Date: Wednesday, April 6
Time: 2:00 pm - 2:45 pm
Track: Sponsored Session
Format: Sponsored Session
Education Level: All
Pass Type: 2-Day Pass, All Access Pass, Expo Pass
Vault Recording: TBD
Audience Level: All
The time domain reflectometer measurement has always used a signal generator to transmit an incident signal to a conductor and a scope to measure the reflection in time. With advanced development in material technology it is very expensive to use a signal generator to transmit a fast-rising incident signal and a scope to measure it.
But, the vector network analyzer allows for a cost-effective solution to replace a signal generator and a scope when a fast-rising incident signal is required.
In this session we will focus on using a vector network analyzer with the time domain reflectometer measurement to achieve the measurement needed when a fast-rising signal incident occurs. There are a few advanced topics that are useful when measuring the time domain reflectometer using a vector network analyzers. The topics are:
1) Advantages and disadvantages using a vector network analyzers for measuring time domain reflectometer
2) Time domain fundamental: low pass time domain and bandpass time domain in vector network analyzers
3) Resolution vs. bandwidth in different window types
4) Examples of side lobes relating to ringing in impulse and step responses
5) Using a vector network analyzer time domain to estimate effective permittivity
6) Applications of time domain gating functions in vector network analyzers
7) How do gating functions affect frequency responses?