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Tutorial – A Practical Guide to Channel Operating Margin (COM) & Effective Return Loss (ERL) Measurements

Steve Sekel (400G/800G Specialist, Keysight Technologies)

Richard Mellitz (Distinguished Engineer, Samtec)

Robert Schaefer (R&D Project Manager, Keysight)

Mike Resso (SI Application Scientist, Keysight Technologies)

Edward Sayre (Distinguished System Engineer, Samtec)

Location: Ballroom C

Date: Tuesday, January 29

Time: 9:00am - 11:50am

Track: 13. Applying Test & Measurement Methodology, 08. Optimizing High-Speed Serial Design

Session Type: Tutorial

Vault Recording: TBD

Audience Level: All

COM and ERL Measurements have become common in the high-speed Ethernet standards and will soon be appearing in new computer bus standards such as PCIe. While these are important tools for the system designer, many do not fully understand them. This session , taught by some of the originators of these measurements, digs deep into the elements of the computation, and how they relate to the actual system. Practical methods of performing the measurements which supply the required parameters will be covered, along with practical methods of measurement system de-embed.


Understand COM and ERL measurements and to be able to confidently perform them in the lab.

Intended Audience


Presentation File