Welcome to the DesignCon 2020 agenda and presentation download site. Here you can view and download conference and/or Chiphead Theater presentations before, during, and after the event. If you’re looking for a presentation from a specific session that you’re unable to find here, it is likely because the presenter has not provided permission for external use or has not yet shared their presentation with us. Please check back after the event for a more complete catalogue of available presentations.
Michael Schnecker (business development manager, Rohde & Schwarz)
Jeff Cuyle (Digital Specialist, Rohde & Schwartz)
Rick Daniel (Applications Engineer , Rohde & Schwarz)
Neil Jarvis (Applications Engineer, Rohde & Schwarz)
Location: Ballroom D
Date: Tuesday, January 28
Time: 1:30pm - 4:30pm
Track: 08. Measurement, Simulation & Improving Jitter, Noise & BER (Pre & Post FEC), 12. Applying Test & Measurement Methodology
Format: Tutorial
Pass Type: All-Access Pass, Alumni All-Access Pass - Get your pass now!
Vault Recording: TBD
Audience Level: Intermediate
Oscilloscopes have been the primary instrument used for signal integrity measurements. As bit rates have become higher, however, traditional RF instruments such as spectrum analyzers, network analyzers and phase noise test sets are becoming essential instruments. This session explains each instrument and its optimum use for signal integrity analysis. The session will present best practices for using each type of instrument as well as its specific signal integrity measurement task.
There are a number of instruments used in signal integrity applications. This session covers the proper application for each instrument as well as best practices for achieving the most accurate and useful measurement results.
A basic understanding of signal integrity is helpful along with some knowledge of electronic measurement equipment. The session is tutorial in nature.