April 5-7, 2022|Santa Clara Convention Center| Santa Clara, CA

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Understanding the Effect of Temperature on Permittivity & Loss of Dielectric Substrates


Allen F. Horn III  (Research Fellow, Rogers Corporation)


Christopher J. caisse  (Sr. Process Technologist, Rogers Corporation)

Location: Ballroom H

Date: Thursday, April 7

Time: 9:00 am - 9:45 am

Track: 04. Advances in Materials & Processing for PCBs, Modules & Packages

Format: Technical Session

Theme : Automotive

Education Level: All

Pass Type: 2-Day Pass, All Access Pass

Vault Recording: TBD

Audience Level: All

A simple analysis of the Clausius-Mosotti equation leads to the conclusion that the effect of temperature on relative permittivity, ε_R, is governed by by two terms: ε_R/3 ( 1/α dα/dT) where α is the polarizability of the material and ε_R (-CTE), where CTE is the coefficient of thermal expansion. In materials where dipole rotation occurs, the change in polarizability term often dominates and the TCεR is positive. The increase in dielectric loss of these materials can be large. In materials where dipole rotation does not occur, the TCεR is generally negative and the magnitude is close to that of 〖 ε〗_R (-CTE). The increase in loss with increasing temperature is relatively small. The temperature coefficient of resistivity of conductive materials is always positive. Conductor loss will increase in increasing temperature. The magnitude of the increase depends on the circuit design.


The listener will leave with an understanding of the basic material properties the govern the effects of temperature on circuit performance.

Intended Audience

An interest in dielectric and conductor properties and the effects on circuit performance.