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Using Multiple Huygens' Boxes to Detect & Quantify the Coupling Path from Noise Source to Victim

Liu Chen Jun (Author, Huawei)

Antonio Ciccomancini Scogna (RFI/EMI Sr Staff Engineer, Huawei)

Jiangqi He (Chief Architect, Huawei)

Cheng Weichang (Senior Engineer, Huawei)

Location: Ballroom G

Date: Wednesday, January 30

Time: 11:00am - 11:45am

Track: 12. Electromagnetic Compatibility/Mitigating Interference

Session Type: Technical Session

Vault Recording: TBD

Audience Level: Intermediate

Huygens' boxes are used to identify and quantify the coupling path from noise to victim in portable electronic devices. The novelty of the proposed methodology is that multiple Huygens' boxes with different sizes are simultaneously defined on the same critical interface (e.g. USB, PCIe, MIPI) to find out the dominant contributor to the noise coupled to the antennas. The simulation reveals the underlying coupling mechanism, which in most of the cases is due to Board-to-Board connectors (BtoB), component pads and regions with severe discontinuities. Conductive coupling is most critical and radiation coupling is kept to minimal values by employing conformal shield or metallic shied cans. The findings can be extended to most of the mobile devices due to repetitive interfaces and similar layout within the product design cycle.


A new methodology which uses Huygens' boxes to identify and quantify the coupling path from noise to victim in portable electronic devices is proposed. The methodology allow to identify the source of greater coupling on a certain path, thus, it can be used at early design stage to modify the layout and/or the set in order to reduce possible interference.

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